E-LIB Suche - Ergebnisse für: Do Kim, Keum

1

A Comparative Study on the Ferroelectric Performances in At..:

Kim, Baek Su ; Hyun, Seung Dam ; Moon, Taehwan...
Nanoscale Research Letters. 15 (2020) 1 - p. , 2020

Link: https://doi.org/10.1186/..

2

Impact of Zr Content in Atomic Layer Deposited Hf1−Zr O2 Th..:

, In: Ferroelectricity in Doped Hafnium Oxide: Materials, Properties and Devices,

Park, Min Hyuk ; Kim, Han Joon ; Do Kim, Keum... - p. 75-101 , 2019

Link: https://doi.org/10.1016/..

3

Contributors:

, In: Ferroelectricity in Doped Hafnium Oxide: Materials, Properties and Devices,

Balke, Nina ; Batra, Rohit ; Böttger, Ulrich... - p. xiii-xv , 2019

Link: https://doi.org/10.1016/..

4

Alternative interpretations for decreasing voltage with inc..:

Song, Seul Ji ; Kim, Yu Jin ; Park, Min Hyuk...
Scientific Reports. 6 (2016) 1 - p. , 2016

Link: https://doi.org/10.1038/..

5

Frustration of Negative Capacitance in Al2O3/BaTiO3 Bilayer..:

Kim, Yu Jin ; Park, Min Hyuk ; Lee, Young Hwan...
Scientific Reports. 6 (2016) 1 - p. , 2016

Link: https://doi.org/10.1038/..

6

Transient Negative Capacitance Effect in Atomic‐Layer‐Depos..:

Kim, Keum Do ; Kim, Yu Jin ; Park, Min Hyuk...
Advanced Functional Materials. 29 (2019) 17 - p. , 2019

Link: https://doi.org/10.1002/..

7

Morphotropic Phase Boundary of Hf1–xZrxO2 Thin Films for Dy..:

Park, Min Hyuk ; Lee, Young Hwan ; Kim, Han Joon...
ACS Applied Materials & Interfaces. 10 (2018) 49 - p. 42666-42673 , 2018

Link: https://doi.org/10.1021/..

8

Dispersion in Ferroelectric Switching Performance of Polycr..:

Hyun, Seung Dam ; Park, Hyeon Woo ; Kim, Yu Jin...
ACS Applied Materials & Interfaces. 10 (2018) 41 - p. 35374-35384 , 2018

Link: https://doi.org/10.1021/..

9

Nucleation‐Limited Ferroelectric Orthorhombic Phase Formati..:

Lee, Young Hwan ; Hyun, Seung Dam ; Kim, Hae Jin...
Advanced Electronic Materials. 5 (2018) 2 - p. , 2018

Link: https://doi.org/10.1002/..

10

Understanding the formation of the metastable ferroelectric..:

Park, Min Hyuk ; Lee, Young Hwan ; Kim, Han Joon...
Nanoscale. 10 (2018) 2 - p. 716-725 , 2018

Link: https://doi.org/10.1039/..

11

Diode Property and Positive Temperature Coefficient of Resi..:

Moon, Taehwan ; Lee, Hyun Jae ; Kim, Keum Do...
Advanced Electronic Materials. 4 (2018) 12 - p. , 2018

Link: https://doi.org/10.1002/..

12

Surface and grain boundary energy as the key enabler of fer..:

Park, Min Hyuk ; Lee, Young Hwan ; Kim, Han Joon...
Nanoscale. 9 (2017) 28 - p. 9973-9986 , 2017

Link: https://doi.org/10.1039/..

13

Voltage Drop in a Ferroelectric Single Layer Capacitor by R..:

Kim, Yu Jin ; Park, Hyeon Woo ; Hyun, Seung Dam...
Nano Letters. 17 (2017) 12 - p. 7796-7802 , 2017

Link: https://doi.org/10.1021/..

14

Scale-up and optimization of HfO2-ZrO2 solid solution thin ..:

Kim, Keum Do ; Lee, Young Hwan ; Gwon, Taehong...
Nano Energy. 39 (2017) - p. 390-399 , 2017

Link: https://doi.org/10.1016/..

15

Research Update: Diode performance of the Pt/Al2O3/two-dime..:

Moon, Taehwan ; Jung, Hae Jun ; Kim, Yu Jin...
APL Materials. 5 (2017) 4 - p. 042301 , 2017

Link: https://doi.org/10.1063/..