Doi, Takuma
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1

Emergence of ferroelectricity in ZrO2 thin films on TiN/Si ..:

Nagano, Jotaro ; Ikeguchi, Shota ; Doi, Takuma...
Materials Science in Semiconductor Processing.  163 (2023)  - p. 107553 , 2023
 
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Descriptor-Free Multi-view Region Matching for Instance-Wis..:

, In: Computer Vision – ACCV 2020; Lecture Notes in Computer Science,
Doi, Takuma ; Okura, Fumio ; Nagahara, Toshiki.. - p. 581-599 , 2021
 
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Effect of carbon in Si oxide interlayers of the Al2O3/4H-Si..:

Doi, Takuma ; Takeuchi, Wakana ; Shibayama, Shigehisa...
Japanese Journal of Applied Physics.  58 (2019)  SB - p. SBBD05 , 2019
 
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Erratum: "Effect of carbon in Si oxide interlayers of the A..:

Doi, Takuma ; Takeuchi, Wakana ; Shibayama, Shigehisa...
Japanese Journal of Applied Physics.  58 (2019)  SB - p. SB9401 , 2019
 
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11

Formation of SiC thin films by chemical vapor deposition wi..:

Doi, Takuma ; Takeuchi, Wakana ; Jin, Yong...
Japanese Journal of Applied Physics.  57 (2017)  1S - p. 01AE08 , 2017
 
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