Dong, Zuoyuan
26  results:
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2

Catching the Missing EM Consequence in Soft Breakdown Relia..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Dong, Zuoyuan ; Sun, Zixuan ; Yang, Xin... - p. 1-2 , 2023
 
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3

Deep Learning for Analysis of Two-Dimensional Materials in ..:

, In: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Sheng, Zhiwei ; Xie, Jing ; Zhang, Shiyi... - p. 1-5 , 2023
 
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5

Thermal conductivity of materials under pressure:

Zhou, Yan ; Dong, Zuo-Yuan ; Hsieh, Wen-Pin..
Nature Reviews Physics.  4 (2022)  5 - p. 319-335 , 2022
 
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10

Interconnection Reliability on FinFET Devices:

, In: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Yang, Xin ; Xue, Yongkang ; Dong, Zuoyuan... - p. 1-4 , 2022
 
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11

Strongly Tunable Raman Resonance in InSe under Pressure:

Huang, Ge ; Zhou, Yan ; Dong, Zuo-Yuan...
The Journal of Physical Chemistry C.  126 (2022)  14 - p. 6344-6350 , 2022
 
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12

Discovery of Superconductivity in Mercury Cadmium Telluride:

Peng, Ya-Kang ; Bai, Feng-Xian ; Huang, Ge...
The Journal of Physical Chemistry C.  125 (2021)  44 - p. 24746-24754 , 2021
 
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