Dow, Wei-Ping
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1

Effect of Copper Grain Size on the Interfacial Microstructu..:

Chan, Po-Fan ; Lee, Hsuan ; Wen, Shih-I...
ACS Applied Electronic Materials.  2 (2020)  2 - p. 464-472 , 2020
 
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2

Polyimide Metallization Using Nickel Nano-Film as both Cata..:

Huang, Shang-En ; Shen, Fang-Yu ; Dow, Wei-Ping
Journal of The Electrochemical Society.  166 (2019)  15 - p. D843-D850 , 2019
 
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3

Electroplated Cu Bump with Ultra-Large Grain without Therma..:

, In: 2019 6th International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D),
Dow, Wei-Ping ; Chan, Po-Fan - p. 36-36 , 2019
 
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4

Spontaneous Potential Oscillation Resulting in Copper Depos..:

Chan, Po-Fan ; Dow, Wei-Ping
Journal of The Electrochemical Society.  166 (2019)  16 - p. D891-D897 , 2019
 
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6

Contrasts in Copper Deposition on Pt(111) Modified by 1-Mer..:

Yau, Shuehlin ; Huang, Yutang ; Dow, Wei-Ping.
Journal of The Electrochemical Society.  165 (2018)  14 - p. D761-D767 , 2018
 
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7

Direct Copper Pattern Plating on Glass and Ceramic Substrat..:

Cheng, Chia-Wen ; Chan, Po-Fan ; Dow, Wei-Ping
Journal of The Electrochemical Society.  164 (2017)  12 - p. D687-D693 , 2017
 
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8

Interactive Effects of Additives and Electrolyte Flow Rate ..:

Lin, Chun-Cheng ; Yen, Chih-Han ; Lin, Sheng-Chi..
Journal of The Electrochemical Society.  164 (2017)  13 - p. D810-D817 , 2017
 
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9

Effects of Additives and Convection on Cu Foil Fabrication ..:

Chan, Po-Fan ; Ren, Rung-Hsuan ; Wen, Shih-I..
Journal of The Electrochemical Society.  164 (2017)  9 - p. D660-D665 , 2017
 
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10

Impurity Incorporation in the Cu Electrodeposit and Its Eff..:

Lee, Hsuan ; Yu, Tai-Yi ; Cheng, Hsi-Kuei...
Journal of The Electrochemical Society.  164 (2017)  7 - p. D457-D462 , 2017
 
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12

Effects of Cu Electroplating Formulas on the Interfacial Mi..:

Yu, Tai-Yi ; Lee, Hsuan ; Hsu, Hsuan-Ling...
Journal of The Electrochemical Society.  163 (2016)  13 - p. D734-D741 , 2016
 
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