E-LIB Suche - Ergebnisse für: Dreesen, R

1

The origin of 'tauw', an enigmatic building stone of the Me..:

Dusar, M. ; Dreesen, R. ; Indeherberge, L...
Netherlands Journal of Geosciences - Geologie en Mijnbouw. 90 (2011) 2-3 - p. 239-258 , 2011

Link: https://doi.org/10.1017/..

2

Using hydrogel filled, embedded tubes to sustain grass tran..:

Lucero, M.E. ; Dreesen, D.R. ; VanLeeuwen, D.M.
Journal of Arid Environments. 74 (2010) 8 - p. 987-990 , 2010

Link: https://doi.org/10.1016/..

3

Resource efficiency of hardware extensions of a 4-issue VLI..:

Jungeblut, T. ; Puttmann, C. ; Dreesen, R....
Advances in Radio Science. 8 (2010) - p. 295-305 , 2010

Link: https://doi.org/10.5194/..

4

Experimental identification of CO2–water–rock interactions ..:

Bertier, P. ; Swennen, R. ; Laenen, B...
Journal of Geochemical Exploration. 89 (2006) 1-3 - p. 10-14 , 2006

Link: https://doi.org/10.1016/..

5

Advantage of In-situ over Ex-situ techniques as reliability..:

Soussan, P. ; Lekens, G. ; Dreesen, R...
Microelectronics Reliability. 43 (2003) 9-11 - p. 1785-1790 , 2003

Link: https://doi.org/10.1016/..

6

Quantitative cDNA-AFLP analysis for genome-wide expression ..:

Breyne, P. ; Dreesen, R. ; Cannoot, B....
Molecular Genetics and Genomics. 269 (2003) 2 - p. 173-179 , 2003

Link: https://doi.org/10.1007/..

7

Statistical aspects of the degradation of LDD nMOSFETs:

Andries, E. ; Dreesen, R. ; Croes, K....
Microelectronics Reliability. 42 (2002) 9-11 - p. 1409-1413 , 2002

Link: https://doi.org/10.1016/..

8

High-resolution SILC measurements of thin SiO2 at ultra low..:

Aresu, S. ; De Ceuninck, W. ; Dreesen, R....
Microelectronics Reliability. 42 (2002) 9-11 - p. 1485-1489 , 2002

Link: https://doi.org/10.1016/..

9

A new degradation model and lifetime extrapolation techniqu..:

Dreesen, R. ; Croes, K. ; Manca, J....
Microelectronics Reliability. 41 (2001) 3 - p. 437-443 , 2001

Link: https://doi.org/10.1016/..

10

High-resolution in-situ of gold electromigration: test time..:

Croes, K. ; Dreesen, R. ; Manca, J....
Microelectronics Reliability. 41 (2001) 9-10 - p. 1439-1442 , 2001

Link: https://doi.org/10.1016/..

11

Modelling hot-carrier degradation of LDD NMOSFETs by using ..:

Dreesen, R. ; Croes, K. ; Manca, J....
Microelectronics Reliability. 39 (1999) 6-7 - p. 785-790 , 1999

Link: https://doi.org/10.1016/..

12

A high resolution method for measuring hot carrier degradat..:

Dreesen, R. ; De Ceuninck, W. ; De Schepper, L..
Microelectronics Reliability. 37 (1997) 10-11 - p. 1533-1536 , 1997

Link: https://doi.org/10.1016/..

13

Sequence stratigraphy of the Frasnian-Famennian transitiona..:

Muchez, Ph. ; Boulvain, F. ; Dreesen, R..
Palaeogeography, Palaeoclimatology, Palaeoecology. 123 (1996) 1-4 - p. 289-296 , 1996

Link: https://doi.org/10.1016/..

14

Laboratory chamber studies and petrographical analysis as b..:

Guillitte, O. ; Dreesen, R.
Science of The Total Environment. 167 (1995) 1-3 - p. 365-374 , 1995

Link: https://doi.org/10.1016/..

15

Palynostratigraphy of the Tournaisian (Hastarian) rocks in ..:

Higgs, K.T. ; Dreesen, R. ; Dusar, M..
Review of Palaeobotany and Palynology. 72 (1992) 1-2 - p. 149-158 , 1992

Link: https://doi.org/10.1016/..