Dreux P
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2

Improvement of MOSFET matching characterization with calibr..:

Welter, L. ; Scotto di Quaquero, J.L. ; Dreux, P....
Microelectronics Reliability.  55 (2015)  9-10 - p. 1328-1333 , 2015
 
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Measurement of the1f72-Neutron-Orbit Radius inCa41:

Platchkov, S. ; Amroun, A. ; Bricault, P....
Physical Review Letters.  61 (1988)  13 - p. 1465-1468 , 1988
 
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