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Drouhin, O. Durand
63
results:
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Format
Online (61)
Print (2)
Mediatypes
Books (2)
Articles (Online) (31)
OpenAccess-fulltext (30)
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english (60)
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1
Influence of disorder on localization and density of states..:
Alibart, F.
;
Lejeune, M.
;
Durand Drouhin, O.
..
Journal of Applied Physics. 108 (2010) 5 - p. , 2010
Link:
https://doi.org/10.1063/..
?
2
Comparison and semiconductor properties of nitrogen doped c..:
Alibart, F.
;
Drouhin, O. Durand
;
Benlahsen, M.
...
Applied Surface Science. 254 (2008) 17 - p. 5564-5568 , 2008
Link:
https://doi.org/10.1016/..
?
3
Evolution of the opto-electronic properties of amorphous ca..:
Alibart, F.
;
Durand Drouhin, O.
;
Lejeune, M.
...
Diamond and Related Materials. 17 (2008) 6 - p. 925-930 , 2008
Link:
https://doi.org/10.1016/..
?
4
Relationship between the structure and the optical and elec..:
Alibart, F.
;
Durand Drouhin, O.
;
Debiemme-Chouvy, C.
.
Solid State Communications. 145 (2008) 7-8 - p. 392-396 , 2008
Link:
https://doi.org/10.1016/..
?
5
Voltage noise across a metal/metal sliding contact as a pro..:
Chevallier, E.
;
Bourny, V.
;
Bouzerar, R.
...
Journal of Applied Physics. 115 (2014) 15 - p. , 2014
Link:
https://doi.org/10.1063/..
?
6
Structural and electrical properties of Bi0.5Na0.5 TiO3 bas..:
Bousquet, M.
;
Batista, L.
;
Dellis, J. L.
...
Journal of Applied Physics. 116 (2014) 19 - p. , 2014
Link:
https://doi.org/10.1063/..
?
7
Influence of the radio-frequency power on the physical and ..:
Manaa, C.
;
Lejeune, M.
;
Kouki, F.
...
Thin Solid Films. 560 (2014) - p. 55-58 , 2014
Link:
https://doi.org/10.1016/..
?
8
Surface roughness and optoelectronic properties of intrinsi..:
Belfedal, A.
;
Benlakehal, D.
;
Bouizem, Y.
...
Materials Science in Semiconductor Processing. 26 (2014) - p. 231-237 , 2014
Link:
https://doi.org/10.1016/..
?
9
On the induced microstructure changes of the amorphous carb..:
Lejeune, M.
;
Durand-Drouhin, O.
;
Charvet, S.
..
Journal of Applied Physics. 101 (2007) 12 - p. , 2007
Link:
https://doi.org/10.1063/..
?
10
Internal stress of sputtered amorphous carbon nitride thin ..:
Durand-Drouhin, O
;
Benlahsen, M
Solid State Communications. 131 (2004) 7 - p. 425-429 , 2004
Link:
https://doi.org/10.1016/..
?
11
Deposition mechanism of sputtered amorphous carbon nitride ..:
Durand-Drouhin, O.
;
Benlahsen, M.
;
Clin, M.
.
Applied Surface Science. 223 (2004) 4 - p. 269-274 , 2004
Link:
https://doi.org/10.1016/..
?
12
Atomic rearrangement of sputtered amorphous carbon nitride ..:
Durand-Drouhin, O.
;
Benlahsen, M.
;
Clin, M.
.
Diamond and Related Materials. 13 (2004) 10 - p. 1854-1858 , 2004
Link:
https://doi.org/10.1016/..
?
13
Microstructure related photoluminescence in a-CNx films dep..:
Lejeune, M.
;
Durand-Drouhin, O.
;
Barthou, C.
...
Solid State Communications. 129 (2004) 2 - p. 107-112 , 2004
Link:
https://doi.org/10.1016/..
?
14
Correlation between plasma parameters, microstructure and o..:
Lejeune, M.
;
Durand-Drouhin, O.
;
Charvet, S.
...
Thin Solid Films. 444 (2003) 1-2 - p. 1-8 , 2003
Link:
https://doi.org/10.1016/..
?
15
Mechanical properties and failure modes of TiAl(Si)N single..:
Durand-Drouhin, O.
;
Santana, A.E.
;
Karimi, A.
..
Surface and Coatings Technology. 163-164 (2003) - p. 260-266 , 2003
Link:
https://doi.org/10.1016/..
1-15