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Drouhin, O. Durand
63  results:
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1

Influence of disorder on localization and density of states..:

Alibart, F. ; Lejeune, M. ; Durand Drouhin, O...
Journal of Applied Physics.  108 (2010)  5 - p. , 2010
Link: https://doi.org/10.1063/..
 
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2

Comparison and semiconductor properties of nitrogen doped c..:

Alibart, F. ; Drouhin, O. Durand ; Benlahsen, M....
Applied Surface Science.  254 (2008)  17 - p. 5564-5568 , 2008
Link: https://doi.org/10.1016/..
 
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3

Evolution of the opto-electronic properties of amorphous ca..:

Alibart, F. ; Durand Drouhin, O. ; Lejeune, M....
Diamond and Related Materials.  17 (2008)  6 - p. 925-930 , 2008
Link: https://doi.org/10.1016/..
 
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4

Relationship between the structure and the optical and elec..:

Alibart, F. ; Durand Drouhin, O. ; Debiemme-Chouvy, C..
Solid State Communications.  145 (2008)  7-8 - p. 392-396 , 2008
Link: https://doi.org/10.1016/..
 
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5

Voltage noise across a metal/metal sliding contact as a pro..:

Chevallier, E. ; Bourny, V. ; Bouzerar, R....
Journal of Applied Physics.  115 (2014)  15 - p. , 2014
Link: https://doi.org/10.1063/..
 
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6

Structural and electrical properties of Bi0.5Na0.5 TiO3 bas..:

Bousquet, M. ; Batista, L. ; Dellis, J. L....
Journal of Applied Physics.  116 (2014)  19 - p. , 2014
Link: https://doi.org/10.1063/..
 
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7

Influence of the radio-frequency power on the physical and ..:

Manaa, C. ; Lejeune, M. ; Kouki, F....
Thin Solid Films.  560 (2014)  - p. 55-58 , 2014
Link: https://doi.org/10.1016/..
 
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8

Surface roughness and optoelectronic properties of intrinsi..:

Belfedal, A. ; Benlakehal, D. ; Bouizem, Y....
Materials Science in Semiconductor Processing.  26 (2014)  - p. 231-237 , 2014
Link: https://doi.org/10.1016/..
 
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9

On the induced microstructure changes of the amorphous carb..:

Lejeune, M. ; Durand-Drouhin, O. ; Charvet, S...
Journal of Applied Physics.  101 (2007)  12 - p. , 2007
Link: https://doi.org/10.1063/..
 
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10

Internal stress of sputtered amorphous carbon nitride thin ..:

Durand-Drouhin, O ; Benlahsen, M
Solid State Communications.  131 (2004)  7 - p. 425-429 , 2004
Link: https://doi.org/10.1016/..
 
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11

Deposition mechanism of sputtered amorphous carbon nitride ..:

Durand-Drouhin, O. ; Benlahsen, M. ; Clin, M..
Applied Surface Science.  223 (2004)  4 - p. 269-274 , 2004
Link: https://doi.org/10.1016/..
 
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12

Atomic rearrangement of sputtered amorphous carbon nitride ..:

Durand-Drouhin, O. ; Benlahsen, M. ; Clin, M..
Diamond and Related Materials.  13 (2004)  10 - p. 1854-1858 , 2004
Link: https://doi.org/10.1016/..
 
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13

Microstructure related photoluminescence in a-CNx films dep..:

Lejeune, M. ; Durand-Drouhin, O. ; Barthou, C....
Solid State Communications.  129 (2004)  2 - p. 107-112 , 2004
Link: https://doi.org/10.1016/..
 
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14

Correlation between plasma parameters, microstructure and o..:

Lejeune, M. ; Durand-Drouhin, O. ; Charvet, S....
Thin Solid Films.  444 (2003)  1-2 - p. 1-8 , 2003
Link: https://doi.org/10.1016/..
 
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15

Mechanical properties and failure modes of TiAl(Si)N single..:

Durand-Drouhin, O. ; Santana, A.E. ; Karimi, A...
Surface and Coatings Technology.  163-164 (2003)  - p. 260-266 , 2003
Link: https://doi.org/10.1016/..
 
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