E-LIB Suche - Ergebnisse für: Drozdov, Yu. N.

1

The use of titanium alloys for details of downhole hammers:

Popelyukh, A I ; Repin, A A ; Alekseev, S E..
IOP Conference Series: Materials Science and Engineering. 124 (2016) - p. 012116 , 2016

Link: https://doi.org/10.1088/..

2

The influence of modification by superdispersed powders on ..:

Semenkov, I V ; Martyushev, N V ; Popelyukh, A I...
IOP Conference Series: Materials Science and Engineering. 124 (2016) - p. 012114 , 2016

Link: https://doi.org/10.1088/..

3

CHARACTERIZATION OF INTERFACE LAYERS OF A SOLID SOLUTION FO..:

Orlov, L. K. ; Vdovin, V. I. ; Drozdov, Yu. N....
Journal of Structural Chemistry. 62 (2021) 4 - p. 630-640 , 2021

Link: https://doi.org/10.1134/..

4

Modification of the Ratio between sp2- to sp3-Hybridized Ca..:

Yunin, P. A. ; Okhapkin, A. I. ; Drozdov, M. N....
Semiconductors. 54 (2020) 9 - p. 1047-1050 , 2020

Link: https://doi.org/10.1134/..

5

SIMS Analysis of Carbon-Containing Materials: Content of Ca..:

Drozdov, M. N. ; Drozdov, Yu. N. ; Okhapkin, A. I....
Technical Physics Letters. 46 (2020) 3 - p. 290-294 , 2020

Link: https://doi.org/10.1134/..

6

The Use of Pulsed Laser Annealing to Form Ohmic Mo/Ti Conta..:

Drozdov, M. N. ; Arkhipova, E. A. ; Drozdov, Yu. N....
Technical Physics Letters. 46 (2020) 6 - p. 551-555 , 2020

Link: https://doi.org/10.1134/..

7

Features of the Vapor-Phase Epitaxy of GaAs on Nonplanar Su..:

Drozdov, Yu. N. ; Kraev, S. A. ; Okhapkin, A. I...
Semiconductors. 54 (2020) 9 - p. 1147-1149 , 2020

Link: https://doi.org/10.1134/..

8

A New Approach to TOF-SIMS Analysis of the Phase Compositio..:

Drozdov, M. N. ; Drozdov, Yu. N. ; Okhapkin, A. I...
Technical Physics Letters. 45 (2019) 1 - p. 48-52 , 2019

Link: https://doi.org/10.1134/..

9

Formation of Low-Resistivity Au/Mo/Ti Ohmic Contacts to p-D..:

Drozdov, M. N. ; Demidov, E. V. ; Drozdov, Yu. N....
Technical Physics. 64 (2019) 12 - p. 1827-1836 , 2019

Link: https://doi.org/10.1134/..

10

A New Limitation of the Depth Resolution in TOF-SIMS Elemen..:

Drozdov, M. N. ; Drozdov, Yu. N. ; Novikov, A. V...
Technical Physics Letters. 44 (2018) 4 - p. 320-323 , 2018

Link: https://doi.org/10.1134/..

11

Study of the Structural and Morphological Properties of HPH..:

Yunin, P. A. ; Volkov, P. V. ; Drozdov, Yu. N....
Semiconductors. 52 (2018) 11 - p. 1432-1436 , 2018

Link: https://doi.org/10.1134/..

12

Verification of the Hypothesis on the Thermoelastic Nature ..:

Drozdov, Yu. N. ; Khrikin, O. I. ; Yunin, P. A.
Semiconductors. 52 (2018) 11 - p. 1491-1494 , 2018

Link: https://doi.org/10.1134/..

13

New Cluster Secondary Ions for Quantitative Analysis of the..:

Drozdov, M. N. ; Drozdov, Yu. N. ; Lobaev, M. A..
Technical Physics Letters. 44 (2018) 4 - p. 297-300 , 2018

Link: https://doi.org/10.1134/..

14

Grazing Incidence X-Ray Diffraction Study of Tantalum Thin ..:

Yunin, P. A. ; Drozdov, Yu. N. ; Gusev, N. S.
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 12 (2018) 4 - p. 701-704 , 2018

Link: https://doi.org/10.1134/..

15

Investigation of the Anisotropy of the Structural Propertie..:

Yunin, P. A. ; Drozdov, Yu. N. ; Khrykin, O. I..
Semiconductors. 52 (2018) 11 - p. 1412-1415 , 2018

Link: https://doi.org/10.1134/..