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Duganapalli, Kishore Kumar
5
results:
Search for persons
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Format
Online (4)
Print (1)
Mediatypes
Articles (Online) (2)
Bookchapter (Online) (1)
Thesis (Online) (1)
Thesis (1)
Sorted by: Relevance
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?
1
Yield analysis via induction of process statistics into the..:
Vudathu, Shyam Praveen
;
Duganapalli, Kishore Kumar
;
Laur, Rainer
..
Microsystem Technologies. 13 (2006) 11-12 - p. 1545-1551 , 2006
Link:
https://doi.org/10.1007/..
?
2
Crosstalk fault modeling in defective pair of interconnects:
Palit, Ajoy K.
;
Duganapalli, Kishore K.
;
Anheier, Walter
Integration. 41 (2008) 1 - p. 27-37 , 2008
Link:
https://doi.org/10.1016/..
?
3
XSIM: An Efficient Crosstalk Simulator for Analysis and Mod..:
, In:
2007 IEEE Design and Diagnostics of Electronic Circuits and Systems
,
Palit, Ajoy K.
;
Duganapalli, Kishore K.
;
Anheier, Walter
- p. None , 2007
Link:
https://doi.org/10.1109/..
?
4
Modelling and Test Generation for Crosstalk Faults in DSM C..:
Duganapalli, Kishore
, 2016
Link:
http://nbn-resolving.de/..
?
5
Modelling and Test Generation for Crosstalk Faults in DSM C..:
Duganapalli, Kishore
, 2016
Copies:
Zentrale:Magazinturm E01
ts 2950
1-5
Related subjects
Zuverlässigkeit. Strahlenwirkung auf elektronische Geräte. Strahlenwirkung auf Halbleiter. Vibrationen