E-LIB Suche - Ergebnisse für: Duperrier, J.

Zhao, Lu ; Zhu, XiaoWen ; Dumas, Jonathan...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 986 (2021) - p. 164716 , 2021

Link: https://doi.org/10.1016/..

7

Prior MDMA administration aggravates MPTP-induced Parkinson..:

Millot, Mathilde ; Saga, Yosuke ; Duperrier, Sandra...
Neurobiology of Disease. 134 (2020) - p. 104643 , 2020

Link: https://doi.org/10.1016/..

8

A case of central diabetes insipidus associated with a cong..:

Duperrier, Cyril ; Fusellier, Marion ; Lenaerts, Hendrik..
Journal of Feline Medicine and Surgery Open Reports. 6 (2020) 2 - p. 205511692093501 , 2020

Link: https://doi.org/10.1177/..

9

Pathophysiology of levodopa-induced dyskinesia: Insights fr..:

Beaudoin-Gobert, Maude ; Météreau, Elise ; Duperrier, Sandra...
NeuroImage. 183 (2018) - p. 132-141 , 2018

Link: https://doi.org/10.1016/..

10

Diffusion tensor imaging marks dopaminergic and serotonergi..:

Météreau, Elise ; Beaudoin‐Gobert, Maude ; Duperrier, Sandra...
Movement Disorders. 33 (2017) 2 - p. 298-309 , 2017

Link: https://doi.org/10.1002/..

11

Characterization and Reliability of [18F]2FNQ1P in Cynomolg..:

Sgambato-Faure, Véronique ; Billard, Thierry ; Météreau, Elise...
Frontiers in Pharmacology. 8 (2017) - p. , 2017

Link: https://doi.org/10.3389/..

12

Ageing of GaN HEMT devices: which degradation indicators?:

Divay, A. ; Latry, O. ; Duperrier, C..
Journal of Semiconductors. 37 (2016) 1 - p. 014001 , 2016

Link: https://doi.org/10.1088/..

13

Imaging Dopamine and Serotonin Systems on MPTP Monkeys: A L..:

Ballanger, Benedicte ; Beaudoin-Gobert, Maude ; Neumane, Sara...
The Journal of Neuroscience. 36 (2016) 5 - p. 1577-1589 , 2016

Link: https://doi.org/10.1523/..

14

Effects of drain quiescent voltage on the ageing of AlGaN/G..:

Divay, A. ; Duperrier, C. ; Temcamani, F..
Microelectronics Reliability. 64 (2016) - p. 585-588 , 2016

Link: https://doi.org/10.1016/..

15

An athermal measurement technique for long time constants t..:

Divay, A. ; Masmoudi, M. ; Latry, O...
Microelectronics Reliability. 55 (2015) 9-10 - p. 1703-1707 , 2015

Link: https://doi.org/10.1016/..