E-LIB Suche - Ergebnisse für: Duru, Romain

1

Quantification of substitutional and interstitial carbon in..:

Vives, Jeremy ; Verdier, Stephane ; Deprat, Fabien...
Journal of Materials Chemistry C. 11 (2023) 26 - p. 8935-8941 , 2023

Link: https://doi.org/10.1039/..

2

Computational model for predicting structural stability and..:

Bordignon, Thomas ; Duriez, Blandine ; Guitard, Nicolas...
Solid-State Electronics. 210 (2023) - p. 108787 , 2023

Link: https://doi.org/10.1016/..

3

Photoluminescence imaging for slip line detection and chara..:

, In: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),

Duru, Romain ; Mica, Isabella ; Frascaroli, Jacopo. - p. 1-6 , 2022

Link: https://doi.org/10.1109/..

4

Full Wafer Process Control Through Object Detection Using R..:

, In: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),

Alcaire, Thomas ; Le Cunff, Delphine ; Tortai, Jean-Herve... - p. 1-5 , 2022

Link: https://doi.org/10.1109/..

5

Reduced Pressure – Chemical Vapor Deposition of Monocrystal..:

Lespiaux, Justine ; Deprat, Fabien ; Vives, Jérémy...
ECS Transactions. 109 (2022) 4 - p. 217-236 , 2022

Link: https://doi.org/10.1149/..

6

Substitutional Carbon Incorporation in SiGeC/Si Heterostruc..:

Vives, Jérémy ; Deprat, Fabien ; Dutartre, Didier...
ECS Transactions. 109 (2022) 4 - p. 237-248 , 2022

Link: https://doi.org/10.1149/..

7

The Impact of Surface Voltage on Photoluminescence Response..:

Nassiet, Thomas ; Duru, Romain ; Le-Cunff, Delphine..
physica status solidi (a). 219 (2021) 9 - p. , 2021

Link: https://doi.org/10.1002/..

8

Fully Depleted, Trench-Pinned Photo Gate for CMOS Image Sen..:

Roy, Francois ; Suler, Andrej ; Dalleau, Thomas...
Sensors. 20 (2020) 3 - p. 727 , 2020

Link: https://doi.org/10.3390/..

9

Investigation of Photoluminescence Voltage PL-V Measurement..:

, In: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),

Nassiet, Thomas ; Duru, Romain ; Le-Cunff, Delphine... - p. 1-6 , 2020

Link: https://doi.org/10.1109/..

10

CMOS Image Sensors and Plasma Processes: How PMD Nitride Ch..:

Sacchettini, Yolène ; Carrère, Jean-Pierre ; Duru, Romain...
Sensors. 19 (2019) 24 - p. 5534 , 2019

Link: https://doi.org/10.3390/..

11

Photoluminescence for in-line buried defects detection in s..:

, In: 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),

Duru, Romain ; Le-Cunff, Delphine ; Cannac, Maxime... - p. 262-266 , 2017

Link: https://doi.org/10.1109/..

12

Oxidation kinetics of Si and SiGe by dry rapid thermal oxid..:

Rozé, Fabien ; Gourhant, Olivier ; Blanquet, Elisabeth...
Journal of Applied Physics. 121 (2017) 24 - p. , 2017

Link: https://doi.org/10.1063/..

13

Comparative Analysis of Growth Rate Enhancement and Ge Redi..:

Rozé, Fabien ; Gourhant, Olivier ; Blanquet, Elisabeth...
ECS Transactions. 75 (2016) 8 - p. 67-78 , 2016

Link: https://doi.org/10.1149/..

14

Quantification of substitutional and interstitial carbon in..:

Vives, Jeremy ; Verdier, Stephane ; Deprat, Fabien...
info:eu-repo/semantics/altIdentifier/doi/10.1039/D3TC01107K. , 2023

Link: https://hal.science/hal-..

15

Quantification of substitutional and interstitial carbon in..:

Vives, Jeremy ; Verdier, Stephane ; Deprat, Fabien...
info:eu-repo/semantics/altIdentifier/doi/10.1039/D3TC01107K. , 2023

Link: https://hal.science/hal-..