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Dutka, Mikhail
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1

Magnetic Sector Secondary Ion Mass Spectrometry on FIB-SEM ..:

De Castro, Olivier ; Audinot, Jean-Nicolas ; Hoang, Hung Quang...
Analytical Chemistry.  94 (2022)  30 - p. 10754-10763 , 2022
Link: https://doi.org/10.1021/..
 
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2

Robotic Fabrication of High-quality Lamellae for Aberration..:

Dutka, Mikhail ; Van Leer, Brandon ; Tsurusawa, Hideyo...
Microscopy and Microanalysis.  28 (2022)  S1 - p. 54-56 , 2022
Link: https://doi.org/10.1017/..
 
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3

A multi-ion plasma FIB study: Determining ion implantation ..:

Eder, Katja ; Bhatia, Vijay ; Qu, Jiangtao...
Ultramicroscopy.  228 (2021)  - p. 113334 , 2021
Link: https://doi.org/10.1016/..
 
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4

Robotic fabrication of high-quality lamellae for aberration..:

Tsurusawa, Hideyo ; Nakanishi, Nobuto ; Kawano, Kayoko...
Scientific Reports.  11 (2021)  1 - p. , 2021
Link: https://doi.org/10.1038/..
 
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5

SIMS Detector on FIB/SEM DualBeam Microscopes for Material ..:

Jiao, Chengge ; Xu, Xu ; Burnett, Timothy...
Microscopy and Microanalysis.  26 (2020)  S2 - p. 408-409 , 2020
Link: https://doi.org/10.1017/..
 
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6

Latest Developments in Multiple Ion Species Plasma FIB Tech..:

Van Leer, Brandon ; Dutka, Mikhail
Microscopy and Microanalysis.  25 (2019)  S2 - p. 570-571 , 2019
Link: https://doi.org/10.1017/..
 
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7

Ar+ FIB Milling and Measurement of FIB Damage in Silicon:

Van Leer, Brandon ; Cheng, Huikai ; Dutka, Mikhail
Microscopy and Microanalysis.  25 (2019)  S2 - p. 886-887 , 2019
Link: https://doi.org/10.1017/..
 
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8

In-situ Low Energy Argon Ion Source for Artifact Free High ..:

Dutka, Mikhail ; Isaacs, Romaine ; Prokhodtseva, Anna.
Microscopy and Microanalysis.  25 (2019)  S2 - p. 548-549 , 2019
Link: https://doi.org/10.1017/..
 
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9

Microstructure evolutions of graded high-vanadium tool stee..:

Cao, Huatang ; Dong, XuanPu ; Chen, Shuqun..
Journal of Alloys and Compounds.  720 (2017)  - p. 169-181 , 2017
Link: https://doi.org/10.1016/..
 
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10

Formation of chain aggregates in external electric field:

Mokhov, Anatoli V. ; Smirnov, Boris M. ; Dutka, Mikhail...
Chemical Physics Letters.  570 (2013)  - p. 104-108 , 2013
Link: https://doi.org/10.1016/..
 
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11

Magnetic Sector Secondary Ion Mass Spectrometry on FIB-SEM ..:

De Castro, Olivier ; Audinot, Jean-Nicolas ; Hoang, Hung Quang...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC9352148/.  , 2022
Link: http://www.ncbi.nlm.nih...
 
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12

Microstructure evolutions of graded high-vanadium tool stee..:

Cao, Huatang ; Dong, XuanPu ; Chen, Shuqun..
https://research.rug.nl/en/publications/e316aee9-aeee-450c-991d-f15bec269db6.  , 2017
Link: https://hdl.handle.net/1..
 
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13

On the formation of copper nanoparticles in nanocluster agg..:

Dutka, Mikhail V ; Turkin, Anatoliy A ; Vainchtein, David I.
https://research.rug.nl/en/publications/7116d396-b8c4-42e4-a55a-48d54474c6d4.  , 2015
Link: https://hdl.handle.net/1..
 
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14

Processing and structure of nanoparticles:Characterization ..:

Dutka, Mikhail Vasilievich
Dutka , M V 2014 , ' Processing and structure of nanoparticles : Characterization and modeling ' , Doctor of Philosophy , University of Groningen , [S.l.] ..  , 2014
Link: http://hdl.handle.net/11..
 
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15

Robotic fabrication of high-quality lamellae for aberration..:

Hideyo Tsurusawa ; Nobuto Nakanishi ; Kayoko Kawano...
https://doi.org/10.1038/s41598-021-00595-x.  , 2021
Link: https://doi.org/10.1038/..
 
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