E-LIB Suche - Ergebnisse für: Dutzi, Katja

1

Wide-range resistivity characterization of semiconductors w..:

Hennig, Joshua ; Klier, Jens ; Duran, Stefan...
Optics Express. , 2024

Link: https://doi.org/10.1364/..

2

Online thickness measurements of acrylate-based coatings on..:

Vieweg, Nico ; Regner, Nadja ; Dutzi, Katja...
Journal of Industrial Textiles. 53 (2023) - p. , 2023

Link: https://doi.org/10.1177/..

3

Thickness Gauging of Waterproof Textiles using Fast THz-TDS:

, In: 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz),

Dutzi, Katja ; Regner, Nadja ; Vieweg, Nico... - p. 1-2 , 2022

Link: https://doi.org/10.1109/..

4

ErAs:In(Al)GaAs photoconductor-based time domain system wit..:

Nandi, Uttam ; Dutzi, Katja ; Deninger, Anselm...
Optics Letters. 45 (2020) 10 - p. 2812 , 2020

Link: https://doi.org/10.1364/..

5

Fastest Thickness Measurements with a Terahertz Time-Domain..:

Yahyapour, Milad ; Jahn, Angelika ; Dutzi, Katja...
Applied Sciences. 9 (2019) 7 - p. 1283 , 2019

Link: https://doi.org/10.3390/..

6

International System of Units (SI) Traceable Noise-Equivale..:

Fernandez Olvera, Anuar ; Roggenbuck, Axel ; Dutzi, Katja...
Photonics. 6 (2019) 1 - p. 15 , 2019

Link: https://doi.org/10.3390/..

7

Identification of Unknown Substances by Terahertz Spectrosc..:

Pohl, Andreas ; Deßmann, Nils ; Dutzi, Katja.
Journal of Infrared, Millimeter, and Terahertz Waves. 37 (2015) 2 - p. 175-188 , 2015

Link: https://doi.org/10.1007/..

8

Wide-range resistivity characterization of semiconductors w..:

Hennig, Joshua ; Klier, Jens ; Duran, Stefan...
http://arxiv.org/abs/2401.12787. , 2024

Link: http://arxiv.org/abs/240..

9

International System of Units (SI) Traceable Noise-Equivale..:

Fernandez Olvera, Anuar de Jesus ; Roggenbuck, Axel ; Dutzi, Katja...
https://tuprints.ulb.tu-darmstadt.de/11362/1/photonics-06-00015-v2.pdf. , 2020

Link: http://tuprints.ulb.tu-d..

10

Fastest Thickness Measurements with a Terahertz Time-Domain..:

Yahyapour, Milad ; Jahn, Angelika ; Dutzi, Katja...
https://opus4.kobv.de/opus4-fau/frontdoor/index/index/docId/11852. , 2019

Link: https://opus4.kobv.de/op..

11

Wide-range resistivity characterization of semiconductors w..:

Joshua Hennig ; Jens Klier ; Stefan Duran...
doi:10.48550/arxiv.2401.12787. , 2024

Link: https://doi.org/10.48550..

12

Wide-range resistivity characterization of semiconductors w..:

Joshua Hennig ; Jens Klier ; Stefan Duran...
doi:10.48550/arxiv.2401.12787. , 2024

Link: https://doi.org/10.48550..

13

Fastest Thickness Measurements with a Terahertz Time-Domain..:

Milad Yahyapour ; Angelika Jahn ; Katja Dutzi...
Optics and Lasers. , 2019

Link: https://doi.org/10.3390/..

14

Fastest Thickness Measurements with a Terahertz Time-Domain..:

Milad Yahyapour ; Angelika Jahn ; Katja Dutzi...
https://www.mdpi.com/2076-3417/9/7/1283. , 2019

Link: https://doi.org/10.3390/..

15

International System of Units (SI) Traceable Noise-Equivale..:

Anuar de Jesus Fernandez Olvera ; Axel Roggenbuck ; Katja Dutzi...
https://www.mdpi.com/2304-6732/6/1/15. , 2019

Link: https://doi.org/10.3390/..