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Eggersgluss, Stephan
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1

A New Static Compaction of Deterministic Test Sets:

Eggersglüß, Stephan ; Milewski, Sylwester ; Rajski, Janusz.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  31 (2023)  4 - p. 411-420 , 2023
Link: https://doi.org/10.1109/..
 
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2

Towards Complete Fault Coverage by Test Point Insertion usi..:

, In: 2019 IEEE International Test Conference (ITC),
Eggersgluss, Stephan - p. 1-8 , 2019
Link: https://doi.org/10.1109/..
 
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3

IEEE European Test Symposium (ETS):

, In: 2019 IEEE International Test Conference (ITC),
Eggersgluss, Stephan ; Hamdioui, Said ; Jutman, Artur... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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4

Approximation-aware testing for approximate circuits:

, In: Proceedings of the 23rd Asia and South Pacific Design Automation Conference,
Chandrasekharan, Arun ; Eggersglüß, Stephan ; Große, Daniel. - p. 239-244 , 2018
Link: https://dl.acm.org/doi/1..
 
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5

Optimization of retargeting for IEEE 1149.1 TAP controllers..:

, In: Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017,
Huhn, Sebastian ; Eggersgluss, Stephan ; Chakrabarty, Krishnendu. - p. 578-583 , 2017
Link: https://doi.org/10.23919..
 
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6

Foreword:

, In: 2017 22nd IEEE European Test Symposium (ETS),
Michael, Maria K. ; Drechsler, Rolf ; Eggersgluss, Stephan... - p. 1-2 , 2017
Link: https://doi.org/10.1109/..
 
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7

Formal Test Point Insertion for Region-based Low-Capture-Po..:

, In: 2016 IEEE 25th Asian Test Symposium (ATS),
Eggersgluss, Stephan ; Holst, Stefan ; Tille, Daniel.. - p. 173-178 , 2016
Link: https://doi.org/10.1109/..
 
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8

Exploring superior structural materials using multi-objecti..:

, In: 2016 Sixth International Symposium on Embedded Computing and System Design (ISED),
Drechsler, Rolf ; Eggersgluss, Stephan ; Ellendt, Nils.. - p. 13-17 , 2016
Link: https://doi.org/10.1109/..
 
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9

Dynamic X-filling for Peak Capture Power Reduction for Comp..:

Eggersglüß, Stephan
Journal of Electronic Testing.  30 (2014)  5 - p. 557-567 , 2014
Link: https://doi.org/10.1007/..
 
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10

Improved SAT-based ATPG : more constraints, better compa..:

, In: Proceedings of the International Conference on Computer-Aided Design,
Eggersglüß, Stephan ; Wille, Robert ; Drechsler, Rolf - p. 85-90 , 2013
Link: https://dl.acm.org/doi/1..
 
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11

High Quality Test Pattern Generation and Boolean Satisfiabi..:

Eggersglüß, Stephan ; Drechsler, Rolf , 2012
Link: https://ebookcentral.pro..
 
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12

Robust algorithms for high quality Test Pattern Generation ..:

, In: 2010 IEEE International Test Conference,
Eggersgluss, Stephan ; Drechsler, Rolf - p. 1-10 , 2010
Link: https://doi.org/10.1109/..
 
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13

MONSOON: SAT-Based ATPG for Path Delay Faults Using Multipl..:

Eggersglüß, Stephan ; Fey, Görschwin ; Glowatz, Andreas...
Journal of Electronic Testing.  26 (2010)  3 - p. 307-322 , 2010
Link: https://doi.org/10.1007/..
 
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14

Speeding up SAT-Based ATPG Using Dynamic Clause Activation:

, In: 2009 Asian Test Symposium,
Eggersgluss, Stephan ; Tille, Daniel ; Drechsler, Rolf - p. None , 2009
Link: https://doi.org/10.1109/..
 
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15

SWORD: A SAT like Prover Using Word Level Information:

, In: VLSI-SoC: Advanced Topics on Systems on a Chip; IFIP – The International Federation for Information Processing,
Wille, Robert ; Fey, Görschwin ; Große, Daniel... - p. 1-17 , 2009
Link: https://doi.org/10.1007/..
 
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