Eichholz, Johannes
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1

Scattering loss in precision metrology due to mirror roughn..:

Drori, Yehonathan ; Eichholz, Johannes ; Edo, Tega...
Journal of the Optical Society of America A.  39 (2022)  5 - p. 969 , 2022
 
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7

Ranging and phase measurement for LISA:

Esteban, Juan Jose ; García, Antonio F ; Eichholz, Johannes...
DOI:https://doi.org/10.1088/1742-6596/228/1/012045.  , 2010
 
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