Ekram, Alif B
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1

Analysing and Detecting Extreme-Selfie Images Using Ensembl..:

, In: 2022 25th International Conference on Computer and Information Technology (ICCIT),
Amin, Al ; Ma, Hongjie ; Alam, Romana... - p. 909-914 , 2022
 
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2

Industrial Product Defect Detection Using Custom U-Net:

, In: 2022 25th International Conference on Computer and Information Technology (ICCIT),
Amin, Al ; Ma, Hongjie ; Shazzad Hossain, Md.... - p. 442-447 , 2022
 
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3

Hybrid Machine Learning model for A Next-Generation Ecofrie..:

, In: 2022 25th International Conference on Computer and Information Technology (ICCIT),
Hossain, Elias ; Rahman, Wahidur ; Ekram, Alif B... - p. 436-441 , 2022
 
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