Em, Vyacheslav
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5

Comparison of crack-arrest fracture toughness between low a..:

An, Gyu Baek ; Woo, Wanchuck ; Park, Jeong Ung.
International Journal of Fracture.  194 (2015)  2 - p. 197-203 , 2015
 
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6

Experimental studies of dispersive double reflections excit..:

Mikula, Pavol ; Vrána, Miroslav ; Šaroun, Jan...
Journal of Applied Crystallography.  45 (2012)  1 - p. 98-105 , 2012
 
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7

Residual stress determination in a dissimilar weld overlay ..:

Woo, Wanchuck ; Em, Vyacheslav ; Hubbard, Camden R...
Materials Science and Engineering: A.  528 (2011)  27 - p. 8021-8027 , 2011
 
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8

Neutron diffraction measurements of residual stresses in a ..:

Woo, Wanchuck ; Em, Vyacheslav ; Mikula, Pavel..
Materials Science and Engineering: A.  528 (2011)  12 - p. 4120-4124 , 2011
 
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9

Effect of wavelength-dependent attenuation on neutron diffr..:

Woo, Wanchuck ; Em, Vyacheslav ; Seong, Baek-Seok...
Journal of Applied Crystallography.  44 (2011)  4 - p. 747-754 , 2011
 
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10

Optimization of a bent perfect Si(111) monochromator at a s..:

Seong, Baek-Seok ; Em, Vyacheslav ; Mikula, Pavol..
Journal of Applied Crystallography.  43 (2010)  3 - p. 654-658 , 2010
 
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11

Present status of residual stress instrument at the HANARO:

Moon, Myung-Kook ; Em, Vyacheslav ; Lee, Chang-Hee...
Physica B: Condensed Matter.  385-386 (2006)  - p. 1038-1039 , 2006
 
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12

High-intensity multi-PSD powder diffractometer at the HANAR:

Lee, Chang-Hee ; Em, Vyacheslav ; Moon, Myung-Kook...
Physica B: Condensed Matter.  385-386 (2006)  - p. 1016-1018 , 2006
 
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13

Study of decomposition and reactions with aluminum matrix o..:

Lee, Jeong-Soo ; Lee, Chang-Hee ; Kim, Ki Hwan.
Journal of Nuclear Materials.  306 (2002)  2-3 - p. 147-152 , 2002
 
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14

Neutron diffraction study of U–5.4 wt% Mo alloy:

Lee, Jeong-Soo ; Lee, Chang-Hee ; Kim, Ki Hwan.
Journal of Nuclear Materials.  280 (2000)  1 - p. 116-119 , 2000
 
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15

Neutron diffraction study of U–10 wt% Mo alloy:

Seong, Baek-Seok ; Lee, Chang-Hee ; Lee, Jeong-Soo...
Journal of Nuclear Materials.  277 (2000)  2-3 - p. 274-279 , 2000
 
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