E-LIB Suche - Ergebnisse für: En-xia, Zhang

1

Influence of nitrogen implantation into the buried oxide on..:

Hai-Ma, Tang ; Zhong-Shan, Zheng ; En-Xia, Zhang...
Chinese Physics B. 19 (2010) 10 - p. 106106 , 2010

Link: https://doi.org/10.1088/..

2

Practical considerations in the design of SRAM cells on SOI:

Wei, He ; Zheng-xuan, Zhang ; En-xia, Zhang...
Microelectronics Journal. 39 (2008) 12 - p. 1829-1833 , 2008

Link: https://doi.org/10.1016/..

3

Ionizing Dose Effect of Thermal Oxides Implanted with Si+Io..:

Ming, Chen ; Hong-Wei, Luo ; Zheng-Xuan, Zhang...
Chinese Physics Letters. 24 (2007) 6 - p. 1775-1777 , 2007

Link: https://doi.org/10.1088/..

4

Improvement of total-dose irradiation hardness of silicon-o..:

En-Xia, Zhang ; Cong, Qian ; Zheng-Xuan, Zhang...
Chinese Physics. 15 (2006) 4 - p. 792-797 , 2006

Link: https://doi.org/10.1088/..

5

Effects of Techniques of Implanting Nitrogen into Buried Ox..:

Zhong-Shan, Zheng ; Zhong-Li, Liu ; Guo-Qiang, Zhang...
Chinese Physics Letters. 22 (2005) 3 - p. 654-656 , 2005

Link: https://doi.org/10.1088/..

6

Effect of the technology of implanting nitrogen into buried..:

Zhong-Shan, Zheng ; Zhong-Li, Liu ; Guo-Qiang, Zhang...
Chinese Physics. 14 (2005) 3 - p. 565-570 , 2005

Link: https://doi.org/10.1088/..

7

Silicon-on-Insulating Multi-Layers for Total-Dose Irradiati..:

En-Xia, Zhang ; Wan-Bing, Yi ; Xiang-Hua, Liu...
Chinese Physics Letters. 21 (2004) 8 - p. 1600-1603 , 2004

Link: https://doi.org/10.1088/..

8

Observation of single event burnout (SEB) in an SOI NLDMOSF..:

Shu, Lei ; Qi, Chun-Hua ; Galloway, Kenneth F....
Microelectronics Reliability. 116 (2021) - p. 113997 , 2021

Link: https://doi.org/10.1016/..

9

Zwitterionic pH-responsive hyaluronic acid polymer micelles..:

Gao, Qin-Qin ; Zhang, Chuan-Min ; Zhang, En-Xia...
Colloids and Surfaces B: Biointerfaces. 178 (2019) - p. 412-420 , 2019

Link: https://doi.org/10.1016/..

10

Improvement of the radiation hardness of SIMOX buried layer..:

Zheng, Zhong-Shan ; Liu, Zhong-Li ; Zhang, Guo-Qiang...
Semiconductor Science and Technology. 20 (2005) 6 - p. 481-484 , 2005

Link: https://doi.org/10.1088/..

11

Charge Trapping in Irradiated 3D Devices and ICs (Invited):

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Zhang, En Xia ; Toguchi, Shintaro ; Guo, Zi Xiang... - p. 10C.3-1-10C.3-6 , 2024

Link: https://doi.org/10.1109/..

12

Effects of Interface Traps and Hydrogen on the Low-Frequenc..:

Fleetwood, Daniel M. ; Zhang, En Xia ; Schrimpf, Ronald D...
IEEE Transactions on Nuclear Science. 71 (2024) 4 - p. 555-568 , 2024

Link: https://doi.org/10.1109/..

13

Random Telegraph Noise and Radiation Response of 80 nm Vert..:

Wynocker, Isabella R. ; Zhang, En Xia ; Reed, Robert A....
IEEE Transactions on Nuclear Science. , 2024

Link: https://doi.org/10.1109/..

14

On-Chip Emulation and Measurement of Variable-Length Photoc..:

D'Amico, Joseph V. ; Vibbert, Sean T. ; Cadena, Rick M....
IEEE Transactions on Nuclear Science. 71 (2024) 4 - p. 500-507 , 2024

Link: https://doi.org/10.1109/..

15

LET and Voltage Dependence of Single-Event Burnout and Sing..:

Sengupta, Arijit ; Ball, Dennis R. ; Sternberg, Andrew L....
IEEE Transactions on Nuclear Science. 71 (2024) 4 - p. 809-815 , 2024

Link: https://doi.org/10.1109/..