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Eom, Dail
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1

Atomic Layer Deposition of Ruthenium Nanoparticles Using a ..:

Heo, Jaeyeong ; Eom, Dail ; Lee, Sang Young...
Chemistry of Materials.  21 (2009)  17 - p. 4006-4011 , 2009
Link: https://doi.org/10.1021/..
 
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2

The Role of the Methyl and Hydroxyl Groups of Low-k Dielect..:

Heo, Jaeyeong ; Won, Seok-Jun ; Eom, Dail...
Electrochemical and Solid-State Letters.  11 (2008)  8 - p. H210 , 2008
Link: https://doi.org/10.1149/..
 
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3

Thermal Annealing Effects on the Atomic Layer Deposited LaA..:

Eom, Dail ; Hwang, Cheol Seong ; Kim, Hyeong Joon..
Electrochemical and Solid-State Letters.  11 (2008)  7 - p. G33 , 2008
Link: https://doi.org/10.1149/..
 
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4

Enhanced Nucleation Behavior of Atomic-Layer-Deposited Ru F..:

Heo, Jaeyeong ; Lee, Sang Young ; Eom, Dail..
Electrochemical and Solid-State Letters.  11 (2008)  2 - p. G5 , 2008
Link: https://doi.org/10.1149/..
 
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5

UV-O3 treatment effects on structural changes of low-k thin..:

Heo, Jaeyeong ; Eom, Dail ; Kim, Hyeong Joon
Microelectronic Engineering.  84 (2007)  9-10 - p. 2188-2191 , 2007
Link: https://doi.org/10.1016/..
 
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6

Improvement in Thermal Stability of Stacked Structures of A..:

Eom, Dail ; No, Sang Yong ; Park, Heechul..
Electrochemical and Solid-State Letters.  10 (2007)  12 - p. G93 , 2007
Link: https://doi.org/10.1149/..
 
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7

Electronic Properties of Atomic-Layer-Deposited Al[sub 2]O[..:

Cheong, Kuan Yew ; Moon, Jeong Hyun ; Eom, Dail...
Electrochemical and Solid-State Letters.  10 (2007)  2 - p. H69 , 2007
Link: https://doi.org/10.1149/..
 
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8

Annealing Effect and Suppression of Hydration of La2O3 Thin..:

Eom, Dail ; No, Sang Young ; Hwang, C.S..
ECS Transactions.  1 (2006)  5 - p. 219-225 , 2006
Link: https://doi.org/10.1149/..
 
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9

Thermal Stability of Stack Structures of Aluminum Nitride a..:

Eom, Dail ; Hwang, Cheol Seong ; Kim, Hyeong Joon
ECS Transactions.  3 (2006)  3 - p. 121-127 , 2006
Link: https://doi.org/10.1149/..
 
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10

Properties of lanthanum oxide thin films deposited by cycli..:

No, Sang Yong ; Eom, Dail ; Hwang, Cheol Seong.
Journal of Applied Physics.  100 (2006)  2 - p. , 2006
Link: https://doi.org/10.1063/..
 
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11

Changes in structures and electrical conduction mechanisms ..:

Eom, Dail ; Jeon, In Sang ; No, Sang Yong..
Journal of Materials Research.  19 (2004)  5 - p. 1516-1523 , 2004
Link: https://doi.org/10.1557/..
 
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12

Investigation of interface trap states in TiN/Al2O3/p-Si ca..:

Jeon, In Sang ; Park, Jaehoo ; Eom, Dail...
Applied Physics Letters.  82 (2003)  7 - p. 1066-1068 , 2003
Link: https://doi.org/10.1063/..
 
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13

Post-Annealing Effects on Fixed Charge and Slow/Fast Interf..:

Jeon, In Sang ; Park, Jaehoo ; Eom, Dail...
Japanese Journal of Applied Physics.  42 (2003)  Part 1, No. 3 - p. 1222-1226 , 2003
Link: https://doi.org/10.1143/..
 
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