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Esebamen, Omeime Xerviar
9  results:
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1

Effect of UV radiation surface damage on silicon position s..:

Esebamen, Omeime Xerviar
Optik.  127 (2016)  2 - p. 599-602 , 2016
Link: https://doi.org/10.1016/..
 
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2

Gridded duo‐lateral position sensitivity detector with high..:

Esebamen, Omeime Xerviar ; Thungström, Göran ; Nilsson, Hans‐Erik.
IET Optoelectronics.  8 (2014)  6 - p. 217-225 , 2014
Link: https://doi.org/10.1049/..
 
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3

Comparative study of UV radiation hardness of n+p and p+n d..:

Esebamen, Omeime Xerviar ; Thungström, Göran ; Nilsson, Hans-Erik.
The European Physical Journal Applied Physics.  68 (2014)  2 - p. 21301 , 2014
Link: https://doi.org/10.1051/..
 
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4

N+P photodetector characterization using the quasi-steady s..:

Esebamen, Omeime Xerviar
Journal of Semiconductors.  33 (2012)  12 - p. 123002 , 2012
Link: https://doi.org/10.1088/..
 
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5

A different approach for determining the responsivity of n+..:

Esebamen, Omeime Xerviar ; Thungström, Göran ; Nilsson, Hans-Erik
Journal of Semiconductors.  33 (2012)  7 - p. 074002 , 2012
Link: https://doi.org/10.1088/..
 
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6

Comparative Study of UV Radiation Hardness of n+p and p+n D..:

Esebamen, Omeime Xerviar ; Thungström, Göran ; Nilsson, Hans-Erik.
European Physical Journal : Applied physics, 1286-0042, 2014, 68:2, s. Art. no. 21301-.  , 2014
Link: http://urn.kb.se/resolve..
 
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7

Characterization of interface states & radiation damage eff..:

Esebamen, Omeime Xerviar
Mid Sweden University doctoral thesis, 1652-893X.  , 2014
Link: http://urn.kb.se/resolve..
 
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8

Simulation, Measurement and Analysis of the Response of Ele..:

Esebamen, Omeime Xerviar
Mid Sweden University licentiate thesis, 1652-8948.  , 2012
Link: http://urn.kb.se/resolve..
 
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9

THE LOGICAL POSSIBILITY FOR A DIVERSE REVENUE SOURCE : The ..:

Esebamen ; Omeime, Xerviar
http://urn.kb.se/resolve?urn=urn:nbn:se:bth-1994.  , 2011
Link: http://urn.kb.se/resolve..
 
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