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Esfeh, Babak Kazemi
104
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Online (104)
Mediatypes
Articles (Online) (43)
Bookchapter (Online) (7)
OpenAccess-fulltext (54)
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english (95)
french (2)
Sorted by: Relevance
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?
1
Extensive Electrical Characterization Methodology of Advanc..:
Kilchytska, Valeriya
;
Makovejev, Sergej
;
Esfeh, Babak Kazemi
...
IEEE Journal of the Electron Devices Society. 9 (2021) - p. 500-510 , 2021
Link:
https://doi.org/10.1109/..
?
2
Electrical characterization of advanced MOSFETs towards ana..:
, In:
2020 IEEE Latin America Electron Devices Conference (LAEDC)
,
Kilchytska, Valeriya
;
Makovejev, Sergej
;
Esfeh, Babak Kazemi
... - p. 1-4 , 2020
Link:
https://doi.org/10.1109/..
?
3
Impact of gate to source/drain alignment on the static and ..:
Han, Qinghua
;
Liu, Mingshan
;
Esfeh, Babak Kazemi
...
Solid-State Electronics. 169 (2020) - p. 107817 , 2020
Link:
https://doi.org/10.1016/..
?
4
Self-Heating in FDSOI UTBB MOSFETs at Cryogenic Temperature..:
Nyssens, Lucas
;
Halder, Arka
;
Esfeh, Babak Kazemi
...
IEEE Journal of the Electron Devices Society. 8 (2020) - p. 789-796 , 2020
Link:
https://doi.org/10.1109/..
?
5
28-nm FD-SOI CMOS RF Figures of Merit Down to 4.2 K:
Nyssens, Lucas
;
Halder, Arka
;
Esfeh, Babak Kazemi
...
IEEE Journal of the Electron Devices Society. 8 (2020) - p. 646-654 , 2020
Link:
https://doi.org/10.1109/..
?
6
Extrinsic gate capacitance compact model for UTBB MOSFETs:
Martinez-Lopez, Andrea G
;
Tinoco, Julio C
;
Lezama, Gamaliel
...
Semiconductor Science and Technology. 33 (2017) 1 - p. 015001 , 2017
Link:
https://doi.org/10.1088/..
?
7
Low‐cost wideband double‐layer microstrip coupled‐line dire..:
Esfeh, Babak Kazemi
;
Raskin, Jean‐Pierre
;
Van Moer, Wendy
Microwave and Optical Technology Letters. 56 (2014) 7 - p. 1570-1575 , 2014
Link:
https://doi.org/10.1002/..
?
8
Prediction of RF performances of advanced MOS transistors f..:
Maafri, Djabar
;
Kazemi Esfeh, Babak
;
Saadi, Abdelhalim
..
Microwave and Optical Technology Letters. 60 (2018) 9 - p. 2256-2262 , 2018
Link:
https://doi.org/10.1002/..
?
9
Compact On-Wafer Test Structures for Device RF Characteriza..:
Kazemi Esfeh, Babak
;
Ben Ali, Khaled
;
Raskin, Jean-Pierre
IEEE Transactions on Electron Devices. 64 (2017) 8 - p. 3101-3107 , 2017
Link:
https://doi.org/10.1109/..
?
10
Advanced MOSFETs Electrical Characterization for Further An..:
Kilchytska, Valeriya
;
Makovejev, Sergei
;
Esfeh, Babak Kazemi
...
boreal:259852. , 2021
Link:
http://hdl.handle.net/20..
?
11
Extensive Electrical Characterization Methodology of Advanc..:
Kilchytska, Valeriya
;
Makovejev, Sergej
;
Esfeh, Babak Kazemi
...
boreal:248902. , 2021
Link:
http://hdl.handle.net/20..
?
12
Extensive Electrical Characterization Methodology of Advanc..:
Kilchytska, Valeriya
;
Makovejev, Sergej
;
Esfeh, Babak Kazemi
...
boreal:248902. , 2021
Link:
http://hdl.handle.net/20..
?
13
Advanced MOSFETs Electrical Characterization for Further An..:
Kilchytska, Valeriya
;
Makovejev, Sergei
;
Esfeh, Babak Kazemi
...
boreal:259852. , 2021
Link:
http://hdl.handle.net/20..
?
14
Self-Heating in FDSOI UTBB MOSFETs at Cryogenic Temperature..:
Nyssens, Lucas
;
Halder, Arka
;
Esfeh, Babak Kazemi
...
boreal:235665. , 2020
Link:
http://hdl.handle.net/20..
?
15
Self-Heating in FDSOI UTBB MOSFETs at Cryogenic Temperature..:
Nyssens, Lucas
;
Halder, Arka
;
Esfeh, Babak Kazemi
...
boreal:235665. , 2020
Link:
http://hdl.handle.net/20..
1-15