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2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) ,
2
Analysis and Compensation of the Series Resistance Effects ..:
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2023 Device Research Conference (DRC) ,
5
Reducing the tunneling barrier thickness of bilayer ferroel..:
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ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) ,
11