Everaert, Jean-Luc
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3

3D Simulation for Melt Laser Anneal Integration in FinFET's..:

Tabata, Toshiyuki ; Curvers, Benoit ; Huet, Karim...
IEEE Journal of the Electron Devices Society.  8 (2020)  - p. 1323-1327 , 2020
 
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6

Review of Silicon Nanowire Oxidation:

Shi, Xiaoping ; Kurstjens, Rufi ; Vos, Ingrid..
ECS Transactions.  34 (2011)  1 - p. 535-540 , 2011
 
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13

Trends in South Asian Linguistics 

Trends in Linguistics. Studies and Monographs [TiLSM] ; 367
 
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