Ewanchuk, J.
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1

Analysis of the degradation mechanisms occurring in the top..:

Dornic, N. ; Ibrahim, A. ; Khatir, Z....
Microelectronics Reliability.  88-90 (2018)  - p. 462-469 , 2018
 
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3

A 99.977% Efficient, 20 kV, 50 A, T-Type Modular Dc Circuit..:

, In: 2023 IEEE Energy Conversion Congress and Exposition (ECCE),
Cong, Yizhou ; Zhang, Yue ; Li, Xiao... - p. 6227-6232 , 2023
 
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6

Thermal Design and Experimental Evaluation of a 1kV, 500A T..:

, In: 2022 IEEE 9th Workshop on Wide Bandgap Power Devices & Applications (WiPDA),
Riar, Baljit ; Ewanchuk, Jeffrey ; Wu, Hailing... - p. 86-90 , 2022
 
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8

Next Generation of Robust Aviation Electrification - Challe..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
 
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12

Moving beyond linear food chains: trait-mediated indirect i..:

Trussell, Geoffrey C. ; Matassa, Catherine M. ; Ewanchuk, Patrick J.
Proceedings of the Royal Society B: Biological Sciences.  284 (2017)  1851 - p. 20162590 , 2017
 
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