E-LIB Suche - Ergebnisse für: Faccio, Federico

1

Radiation-Induced Charge Trapping in Shallow Trench Isolati..:

Bonaldo, Stefano ; Wallace, Trace ; Barnaby, Hugh...
IEEE Transactions on Nuclear Science. 71 (2024) 4 - p. 427-436 , 2024

Link: https://doi.org/10.1109/..

2

Characteristics and ultra-high total ionizing dose response..:

Termo, Gennaro ; Borghello, Giulio ; Faccio, Federico...
Journal of Instrumentation. 19 (2024) 3 - p. C03039 , 2024

Link: https://doi.org/10.1088/..

3

Special NSREC 2023 Issue of the IEEE Transactions on Nuclea..:

Fleetwood, Dan ; Quinn, Heather ; Moss, Steven...
IEEE Transactions on Nuclear Science. 71 (2024) 4 - p. 367-367 , 2024

Link: https://doi.org/10.1109/..

4

Comments by the Editors:

Fleetwood, Dan ; Quinn, Heather ; Robinson, William...
IEEE Transactions on Nuclear Science. 70 (2023) 8 - p. 1529-1529 , 2023

Link: https://doi.org/10.1109/..

5

Special NSREC 2022 Issue of the IEEE Transactions on Nuclea..:

Fleetwood, Dan ; Brown, Dennis ; Quinn, Heather...
IEEE Transactions on Nuclear Science. 70 (2023) 4 - p. 300-300 , 2023

Link: https://doi.org/10.1109/..

6

ASIC survival in the radiation environment of the LHC exper..:

Faccio, Federico
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 1045 (2023) - p. 167569 , 2023

Link: https://doi.org/10.1016/..

7

Regulated Resonant Switched-Capacitor Point-of-Load Convert..:

Ripamonti, Giacomo ; Ursino, Mario ; Saggini, Stefano..
IEEE Transactions on Power Electronics. 36 (2021) 4 - p. 4815-4827 , 2021

Link: https://doi.org/10.1109/..

8

Modeling of High Total Ionizing Dose (TID) Effects for Encl..:

, In: 2018 International Semiconductor Conference (CAS),

Nikolaou, Aristeidis ; Bucher, Matthias ; Makris, Nikolaos... - p. 133-136 , 2018

Link: https://doi.org/10.1109/..

9

Total ionizing dose effects in shallow trench isolation oxi..:

Faccio, Federico ; Barnaby, Hugh J. ; Chen, Xiao J....
Microelectronics Reliability. 48 (2008) 7 - p. 1000-1007 , 2008

Link: https://doi.org/10.1016/..

10

Forward and reverse operation of enclosed-gate MOSFETs and ..:

Νικολαου Αριστειδης(http://users.isc.tuc.gr/~Anikolaou) ; Nikolaou Aristeidis(http://users.isc.tuc.gr/~Anikolaou) ; Χεβας Λουκας(http://users.isc.tuc.gr/~lchevas)...
info:eu-repo/grantAgreement/EC/FP7/246686. , 2020

Link: http://purl.tuc.gr/dl/di..

11

Investigation of scaling and temperature effects in total i..:

Χεβας Λουκας(http://users.isc.tuc.gr/~lchevas) ; Chevas Loukas(http://users.isc.tuc.gr/~lchevas) ; Νικολαου Αριστειδης(http://users.isc.tuc.gr/~Anikolaou)...
info:eu-repo/grantAgreement/EC/FP7/246686. , 2019

Link: http://purl.tuc.gr/dl/di..

12

Total ionizing dose effects on analog performance of 65 nm ..:

Bucher Matthias(http://users.isc.tuc.gr/~mbucher) ; Νικολαου Αριστειδης(http://users.isc.tuc.gr/~Anikolaou) ; Nikolaou Aristeidis(http://users.isc.tuc.gr/~Anikolaou)...
info:eu-repo/grantAgreement/EC/FP7/246686. , 2019

Link: http://purl.tuc.gr/dl/di..

13

Modeling of high total ionizing dose (TID) effects for encl..:

Νικολαου Αριστειδης(http://users.isc.tuc.gr/~Anikolaou) ; Nikolaou Aristeidis(http://users.isc.tuc.gr/~Anikolaou) ; Bucher Matthias(http://users.isc.tuc.gr/~mbucher)...
info:eu-repo/grantAgreement/EC/FP7/246686. , 2019

Link: http://purl.tuc.gr/dl/di..

14

Extending a 65nm CMOS process design kit for high total ion..:

Νικολαου Αριστειδης(http://users.isc.tuc.gr/~Anikolaou) ; Nikolaou Aristeidis(http://users.isc.tuc.gr/~Anikolaou) ; Bucher Matthias(http://users.isc.tuc.gr/~mbucher)...
info:eu-repo/grantAgreement/EC/FP7/246686. , 2019

Link: http://purl.tuc.gr/dl/di..

15

Layout techniques to enhance the radiation tolerance of sta..:

A. Marchioro ; A. Cavagnoli ; S. Di Liberto...
url:https://www.openaccessrepository.it/communities/itmirror. , 2000

Link: https://www.openaccessre..