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Farrant, David
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1

THz reflection system for hyperspectral three-dimensional i..:

Gretzinger, Thomas ; Radhanpura, Krunal ; Fairman, Philip..
Optics Express.  , 2023
Link: https://doi.org/10.1364/..
 
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2

On the use of a volume constraint to account for thermal ex..:

Rogers, Fergus J. M. ; Radhanpura, Krunal ; Horvat, Joseph.
Physical Chemistry Chemical Physics.  24 (2022)  17 - p. 10408-10419 , 2022
Link: https://doi.org/10.1039/..
 
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3

Automated Analysis of Reflection Mode Terahertz Hyperspectr..:

Berman, Mark ; Radhanpura, Krunal ; Farrant, David
IEEE Transactions on Terahertz Science and Technology.  12 (2022)  4 - p. 370-384 , 2022
Link: https://doi.org/10.1109/..
 
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4

Measuring coalignment of retroreflectors with large lateral..:

Schütze, Daniel ; Farrant, David ; Shaddock, Daniel A....
Review of Scientific Instruments.  85 (2014)  3 - p. , 2014
Link: https://doi.org/10.1063/..
 
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5

Fabrication and metrology of lithium niobate narrowband opt..:

Gensemer, Stephen D. ; Farrant, David
Advanced Optical Technologies.  3 (2014)  3 - p. 309-314 , 2014
Link: https://doi.org/10.1515/..
 
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6

Copper-Capped Carbon Nanocones on Silicon: Plasma-Enabled G..:

Kumar, Shailesh ; Levchenko, Igor ; Farrant, David...
ACS Applied Materials & Interfaces.  4 (2012)  11 - p. 6021-6029 , 2012
Link: https://doi.org/10.1021/..
 
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7

Sub-nanometer metrology of optical wafers using an angle-sc..:

Arkwright, John ; Farrant, David ; Zhang, Jun
Optics Express.  14 (2006)  1 - p. 114 , 2006
Link: https://doi.org/10.1364/..
 
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8

Measuring the thickness profiles of wafers to subnanometer ..:

Farrant, David I. ; Arkwright, John W. ; Fairman, Philip S..
Applied Optics.  46 (2007)  15 - p. 2863 , 2007
Link: https://doi.org/10.1364/..
 
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9

Sensitivity errors in interferometric deformation metrology:

Farrant, David I. ; Petzing, Jon N.
Applied Optics.  42 (2003)  28 - p. 5634 , 2003
Link: https://doi.org/10.1364/..
 
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10

Calibration of a 300-mm-aperture phase-shifting Fizeau inte..:

Oreb, Bozenko (Bob) F. ; Farrant, David I. ; Walsh, Christopher J...
Applied Optics.  39 (2000)  28 - p. 5161 , 2000
Link: https://doi.org/10.1364/..
 
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11

Fabrication and measurement of optics for the Laser Interfe..:

Walsh, Christopher J. ; Leistner, Achim J. ; Seckold, Jeffrey..
Applied Optics.  38 (1999)  13 - p. 2870 , 1999
Link: https://doi.org/10.1364/..
 
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12

Measurement of transient deformations with dual-pulse addit..:

Farrant, David I. ; Kaufmann, Guillermo H. ; Petzing, Jon N....
Applied Optics.  37 (1998)  31 - p. 7259 , 1998
Link: https://doi.org/10.1364/..
 
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13

Phase-shifting algorithms for nonlinear and spatially nonun..:

Hibino, Kenichi ; Larkin, Kieran G. ; Oreb, Bob F..
Journal of the Optical Society of America A.  15 (1998)  5 - p. 1234 , 1998
Link: https://doi.org/10.1364/..
 
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14

Phase-shifting algorithms for nonlinear and spatially nonun..:

Hibino, Kenichi ; Oreb, Bob F. ; Farrant, David I..
Journal of the Optical Society of America A.  14 (1997)  4 - p. 918 , 1997
Link: https://doi.org/10.1364/..
 
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15

Phase shifting algorithms for non-sinusoidal waveforms with..:

Hibino, Kenichi ; Oreb, Bob F. ; Farrant, David I..
Optical Review.  1 (1994)  2 - p. 270-272 , 1994
Link: https://doi.org/10.1007/..
 
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