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Favalli, Michele
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1

Cross-Layer Reliability Analysis of NVDLA Accelerators: Exp..:

, In: 2024 IEEE European Test Symposium (ETS),
Veronesi, Alessandro ; Nazzari, Alessandro ; Passarello, Dario... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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2

Efficient Resource-Aware Neural Architecture Search with a ..:

, In: 2023 IEEE 16th International Symposium on Embedded Multicore/Many-core Systems-on-Chip (MCSoC),
Bellodi, Elena ; Bertozzi, Davide ; Bizzarri, Alice... - p. 171-178 , 2023
Link: https://doi.org/10.1109/..
 
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3

The Challenge of Classification Confidence Estimation in Dy..:

, In: Lecture Notes in Computer Science; Embedded Computer Systems: Architectures, Modeling, and Simulation,
Dall'Occo, Francesco ; Bueno-Crespo, Andrés ; Abellán, José L... - p. 505-522 , 2022
Link: https://doi.org/10.1007/..
 
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4

Techniques for SAT-Based Boolean Reasoning on Multiple Faul..:

Dall'Occo, Francesco ; Dalpasso, Marcello ; Favalli, Michele
Electronics.  11 (2022)  3 - p. 382 , 2022
Link: https://doi.org/10.3390/..
 
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5

A Scalable Bidimensional Randomization Scheme for TLC 3D NA..:

Favalli, Michele ; Zambelli, Cristian ; Marelli, Alessia..
Micromachines.  12 (2021)  7 - p. 759 , 2021
Link: https://doi.org/10.3390/..
 
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6

Efficient testing of multi‐output combinational cells in na..:

Valenti, Lorenzo ; Dalpasso, Marcello ; Favalli, Michele
IET Computers & Digital Techniques.  8 (2014)  2 - p. 83-89 , 2014
Link: https://doi.org/10.1049/..
 
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7

A complete self-testing and self-configuring NoC infrastruc..:

Ghiribaldi, Alberto ; Ludovici, Daniele ; Triviño, Francisco...
ACM Transactions on Embedded Computing Systems (TECS).  12 (2013)  4 - p. 1-29 , 2013
Link: https://dl.acm.org/doi/1..
 
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8

A complete self-testing and self-configuring NoC infrastruc..:

Ghiribaldi, Alberto ; Ludovici, Daniele ; Triviño, Francisco...
ACM Transactions on Embedded Computing Systems.  12 (2013)  4 - p. 1-29 , 2013
Link: https://doi.org/10.1145/..
 
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9

How Many Test Vectors We Need to Detect a Bridging Fault?:

Favalli, Michele ; Dalpasso, Marcello
Journal of Electronic Testing.  25 (2008)  1 - p. 79-95 , 2008
Link: https://doi.org/10.1007/..
 
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10

On-line testing and diagnosis of bus lines with respect to ..:

, In: Proceedings of the conference on Design, automation and test in Europe,
Metra, Cecilia ; Favalli, Michele ; Riccó, Bruno - p. 763 ff. , 2000
Link: https://dl.acm.org/doi/1..
 
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11

Virtual fault simulation of distributed IP-based designs:

, In: Proceedings of the conference on Design, automation and test in Europe,
Dalpasso, Marcello ; Bogliolo, Alessandro ; Benini, Luca. - p. 99-105 , 2000
Link: https://dl.acm.org/doi/1..
 
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12

On the design of self-checking functional units based on Sh..:

, In: Proceedings of the conference on Design, automation and test in Europe,
Favalli, Michele ; Metra, Cecilia - p. 77-es , 1999
Link: https://dl.acm.org/doi/1..
 
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13

Signal Coding and CMOS Gates for Combinational Functional B..:

Metra, Cecilia ; Favalli, Michele ; Riccò, Bruno
VLSI Design.  11 (1999)  1 - p. 23-34 , 1999
Link: https://doi.org/10.1155/..
 
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14

Dynamic effects in the detection of bridging faults in CMOS..:

Favalli, Michele ; Olivo, Piero ; Ricc�, Bruno
Journal of Electronic Testing.  3 (1992)  3 - p. 197-205 , 1992
Link: https://doi.org/10.1007/..
 
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15

A Scalable Bidimensional Randomization Scheme for TLC 3D NA..:

Favalli, Michele ; Zambelli, Cristian ; Marelli, Alessia..
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC8305298/.  , 2021
Link: http://www.ncbi.nlm.nih...
 
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