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Faynot, Olivier
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1

Two-level Stacked Nanowire MOSFETs: A Low Temperature Analy..:

Calçade Rodrigues, Jaime ; Cassé, Mikael ; Barraud, Sylvain...
Journal of Integrated Circuits and Systems.  19 (2024)  2 - p. 1-5 , 2024
Link: https://doi.org/10.29292..
 
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2

Comprehensive Evaluation of Junctionless and Inversion-Mode..:

Prates, Rhaycen R. ; Barraud, Sylvain ; Cassé, Mikael...
IEEE Journal of the Electron Devices Society.  , 2024
Link: https://doi.org/10.1109/..
 
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3

Comprehensive evaluation of gate-induced drain leakage in S..:

de Souza, Michelly ; Cerdeira, Antonio ; Estrada, Magali...
Solid-State Electronics.  214 (2024)  - p. 108865 , 2024
Link: https://doi.org/10.1016/..
 
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4

High Temperature and Width Influence on the GIDL of Nanowir..:

De Souza, Michelly ; Cerdeira, Antonio ; Estrada, Magali...
IEEE Journal of the Electron Devices Society.  11 (2023)  - p. 672-680 , 2023
Link: https://doi.org/10.1109/..
 
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5

Disruptive approaches towards Energy Efficient VLSI Technol..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
Faynot, Olivier ; Barraud, Sylvain ; Dubreuil, Theophile... - p. 1-2 , 2023
Link: https://doi.org/10.1109/..
 
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6

Experimental assessment of gate-induced drain leakage in SO..:

de Souza, Michelly ; Cerdeira, Antonio ; Estrada, Magali...
Solid-State Electronics.  208 (2023)  - p. 108716 , 2023
Link: https://doi.org/10.1016/..
 
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7

Electrical Characterization of Ω-Gate Nanowire MOSFETs Down..:

, In: 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro),
Matos, Jefferson Almeida ; de Souza, Michelly ; Casse, Mikael... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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8

Low-field Mobility Degradation Factors Temperature Dependen..:

, In: 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro),
Rodrigues, Jaime Calcade ; Casse, Mikael ; Barraud, Sylvain... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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9

Extraction of Drain Current Variability Components in Junct..:

, In: 2023 International Conference on Noise and Fluctuations (ICNF),
da Silva, Lucas Mota Barbosa ; Pavanello, Marcelo Antonio ; Casse, Mikael... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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10

Impact of series resistance on the drain current variabilit..:

da Silva, Lucas Mota Barbosa ; Pavanello, Marcelo Antonio ; Cassé, Mikaël...
Solid-State Electronics.  208 (2023)  - p. 108737 , 2023
Link: https://doi.org/10.1016/..
 
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11

Experimental Comparison of Junctionless and Inversion-Mode ..:

, In: 2022 36th Symposium on Microelectronics Technology (SBMICRO),
Prates, Rhaycen R. ; Barraud, Sylvain ; Casse, Mikael... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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12

Electrical characteristics of n-type vertically stacked nan..:

Mariniello, Genaro ; Barraud, Sylvain ; Vinet, Maud...
Solid-State Electronics.  194 (2022)  - p. 108337 , 2022
Link: https://doi.org/10.1016/..
 
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13

Analysis of the Gate-Induced Drain Leakage of SOI Nanowire ..:

, In: 2022 IEEE Latin American Electron Devices Conference (LAEDC),
de Souza, Michelly ; Cerdeira, Antonio ; Estrada, Magali... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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14

Analysis of Variability in Transconductance and Mobility of..:

, In: 2022 36th Symposium on Microelectronics Technology (SBMICRO),
Barbosa da Silva, Lucas Mota ; Pavanello, Marcelo Antonio ; Casse, Mikael... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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15

Extraction of the Back Channel Mobility in SOI Nanowire MOS..:

, In: 2022 IEEE Latin American Electron Devices Conference (LAEDC),
Bergamaschi, Flavio E. ; Wirth, Gilson I. ; Barraud, Sylvain... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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