Search for persons
X
?
2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT) ,
5
Disruptive approaches towards Energy Efficient VLSI Technol..:
, In:
?
2023 37th Symposium on Microelectronics Technology and Devices (SBMicro) ,
7
Electrical Characterization of Ω-Gate Nanowire MOSFETs Down..:
, In:
?
2023 37th Symposium on Microelectronics Technology and Devices (SBMicro) ,
8
Low-field Mobility Degradation Factors Temperature Dependen..:
, In:
?
2023 International Conference on Noise and Fluctuations (ICNF) ,
9
Extraction of Drain Current Variability Components in Junct..:
, In:
?
2022 36th Symposium on Microelectronics Technology (SBMICRO) ,
11
Experimental Comparison of Junctionless and Inversion-Mode ..:
, In:
?
2022 IEEE Latin American Electron Devices Conference (LAEDC) ,
13
Analysis of the Gate-Induced Drain Leakage of SOI Nanowire ..:
, In:
?
2022 36th Symposium on Microelectronics Technology (SBMICRO) ,
14
Analysis of Variability in Transconductance and Mobility of..:
, In:
?
2022 IEEE Latin American Electron Devices Conference (LAEDC) ,
15