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Feng, Haonan
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1

Charge Transport in Blue Quantum Dot Light‐Emitting Diodes:

Li, Shuxin ; Lin, Wenxin ; Feng, Haonan...
Advanced Electronic Materials.  , 2024
Link: https://doi.org/10.1002/..
 
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2

Mechanistic modelling of relative biological effectiveness ..:

Feng, Haonan ; Li, Weiguang ; Zhang, Yibao...
Physics in Medicine & Biology.  69 (2024)  3 - p. 035020 , 2024
Link: https://doi.org/10.1088/..
 
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3

Study of pristine and degraded blue quantum dot light-emitt..:

Lin, Wenxin ; Huang, Jiangxia ; Li, Shuxin...
Journal of Applied Physics.  135 (2024)  4 - p. , 2024
Link: https://doi.org/10.1063/..
 
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4

Study on the fabrication and performance of hierarchical po..:

Liang, Junjie ; Lian, Xiaojie ; Lu, Yi...
Materials Today Communications.  39 (2024)  - p. 108637 , 2024
Link: https://doi.org/10.1016/..
 
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5

Harnessing oriented arrangement of collagen fibers by 3D pr..:

Zhou, Yi ; Lian, Xiao-Jie ; Lu, Yi...
Biomedical Materials.  19 (2024)  4 - p. 045020 , 2024
Link: https://doi.org/10.1088/..
 
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6

Analog circuit fault diagnosis based on enhanced Harris Haw..:

Feng, Haonan ; Li, Gang ; Yu, Jianjie..
Engineering Reports.  5 (2023)  6 - p. , 2023
Link: https://doi.org/10.1002/..
 
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7

Effect of topical antibiotics on the prevention and managem..:

Zhang, Meixue ; Feng, Haonan ; Gao, Yongtao..
International Wound Journal.  20 (2023)  10 - p. 4015-4022 , 2023
Link: https://doi.org/10.1111/..
 
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8

A decrease in TDDB Lifetime of Commercial SiC power MOSFETs..:

, In: 2022 19th China International Forum on Solid State Lighting & 2022 8th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS),
Yang, Sheng ; Feng, Haonan ; Yu, Xuefeng. - p. 38-42 , 2023
Link: https://doi.org/10.1109/..
 
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9

Study of bias-induced total ionizing dose radiation damage ..:

Liang, Xiaowen ; Pu, Xiaojuan ; Feng, Haonan...
Radiation Effects and Defects in Solids.  178 (2023)  3-4 - p. 510-520 , 2023
Link: https://doi.org/10.1080/..
 
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10

LINC00511, a future star for the diagnosis and therapy of d..:

Ji, Daolin ; Feng, Haonan ; Hou, Li...
Pathology - Research and Practice.  244 (2023)  - p. 154382 , 2023
Link: https://doi.org/10.1016/..
 
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11

Oxide Electric Field-Induced Degradation of SiC MOSFET for ..:

Liang, Xiaowen ; Feng, Haonan ; Xiang, Yutang...
Electronics.  12 (2023)  13 - p. 2886 , 2023
Link: https://doi.org/10.3390/..
 
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12

Multi-stage collaborative resilient enhancement strategy fo..:

Liu, Yanli ; Feng, Haonan ; Hatziargyriou, Nikos D.
Applied Energy.  348 (2023)  - p. 121560 , 2023
Link: https://doi.org/10.1016/..
 
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13

Total ionizing dose effects of 60Co-γ ray radiation on SiC ..:

Feng, Haonan ; Liang, Xiaowen ; Sun, Jing...
Radiation Effects and Defects in Solids.  , 2023
Link: https://doi.org/10.1080/..
 
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14

FIDO Gets Verified: A Formal Analysis of the Universal Auth..:

Feng, Haonan ; Guan, Jingjing ; Li, Hui..
IEEE Transactions on Dependable and Secure Computing.  20 (2023)  5 - p. 4291-4310 , 2023
Link: https://doi.org/10.1109/..
 
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15

Refined Analysis of Leakage Current in SiC Power Metal Oxid..:

Xiang, Yutang ; Liang, Xiaowen ; Feng, Jie...
Electronics.  12 (2023)  20 - p. 4349 , 2023
Link: https://doi.org/10.3390/..
 
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