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Fieback, Moritz
45  results:
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1

Online Detection of Unique Faults in RRAMs:

, In: 2024 IEEE European Test Symposium (ETS),
Xun, Hanzhi ; Fieback, Moritz ; Yaldagard, Mohammad Amin... - p. 1-2 , 2024
Link: https://doi.org/10.1109/..
 
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2

Design-for-Test for Intermittent Faults in STT-MRAMs:

, In: 2024 IEEE European Test Symposium (ETS),
Yuan, Sicong ; Yaldagard, Mohammad Amin ; Xun, Hanzhi... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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3

Lifecycle Management of Emerging Memories:

, In: 2024 IEEE European Test Symposium (ETS),
Fieback, Moritz ; Pohls, Leticia Maria Bolzani - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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4

Device-Aware Test for Ion Depletion Defects in RRAMs:

, In: 2023 IEEE International Test Conference (ITC),
Xun, Hanzhi ; Yuan, Sicong ; Fieback, Moritz... - p. 246-255 , 2023
Link: https://doi.org/10.1109/..
 
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5

Data Background-Based Test Development for All Interconnect..:

, In: 2023 IEEE European Test Symposium (ETS),
Xun, Hanzhi ; Fieback, Moritz ; Yuan, Sicong... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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6

Device-Aware Test for Back-Hopping Defects in STT-MRAMs:

, In: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE),
Yuan, Sicong ; Taouil, Mottaqiallah ; Fieback, Moritz... - p. 1-6 , 2023
Link: https://doi.org/10.23919..
 
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7

Online Fault Detection and Diagnosis in RRAM:

, In: 2023 IEEE European Test Symposium (ETS),
Fieback, Moritz ; Bradaric, Filip ; Taouil, Mottaqiallah. - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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8

Dependability of Future Edge-AI Processors: Pandora's Box:

, In: 2023 IEEE European Test Symposium (ETS),
Gomony, Manil Dev ; Gebregiorgis, Anteneh ; Fieback, Moritz... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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9

Device Aware Diagnosis for Unique Defects in STT-MRAMs:

, In: 2023 IEEE 32nd Asian Test Symposium (ATS),
Aouichi, Ahmed ; Yuan, Sicong ; Fieback, Moritz... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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10

Characterization and Test of Intermittent Over RESET in RRA..:

, In: 2023 IEEE 32nd Asian Test Symposium (ATS),
Xun, Hanzhi ; Fieback, Moritz ; Yuan, Sicong... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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11

Using Hopfield Networks to Correct Instruction Faults:

, In: 2022 IEEE 31st Asian Test Symposium (ATS),
Koylu, Troya Cagil ; Fieback, Moritz ; Hamdioui, Said. - p. 102-107 , 2022
Link: https://doi.org/10.1109/..
 
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12

PVT Analysis for RRAM and STT-MRAM-based Logic Computation-..:

, In: 2022 IEEE European Test Symposium (ETS),
Fieback, Moritz ; Munch, Christopher ; Gebregiorgis, Anteneh... - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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13

Defects, Fault Modeling, and Test Development Framework for..:

Fieback, Moritz ; Medeiros, Guilherme Cardoso ; Wu, Lizhou...
ACM Journal on Emerging Technologies in Computing Systems.  18 (2022)  3 - p. 1-26 , 2022
Link: https://doi.org/10.1145/..
 
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14

Accelerating RRAM Testing with a Low-cost Computation-in-Me..:

, In: 2022 IEEE International Test Conference (ITC),
Singh, Abhairaj ; Fieback, Moritz ; Bishnoi, Rajendra... - p. 400-409 , 2022
Link: https://doi.org/10.1109/..
 
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15

Structured Test Development Approach for Computation-in-Mem..:

, In: 2022 IEEE International Test Conference in Asia (ITC-Asia),
Fieback, Moritz ; Taouil, Mottaqiallah ; Hamdioui, Said - p. 61-66 , 2022
Link: https://doi.org/10.1109/..
 
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