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Findenig, B.
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Monitoring of parameter stability of SiC MOSFETs in real ap..:

Sievers, M. ; Findenig, B. ; Glavanovics, M...
Microelectronics Reliability.  114 (2020)  - p. 113731 , 2020
Link: https://doi.org/10.1016/..
 
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Modular application relevant stress testing for next genera..:

Sievers, M. ; Glavanovics, M. ; Rhinow, C..
Microelectronics Reliability.  100-101 (2019)  - p. 113330 , 2019
Link: https://doi.org/10.1016/..
 
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