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Flater, Erin E
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1
Error estimation and enhanced stiffness sensitivity in cont..:
Flater, Erin E
;
Mugdha, Arya C
;
Gupta, Saurabh
...
Measurement Science and Technology. 31 (2020) 11 - p. 115009 , 2020
Link:
https://doi.org/10.1088/..
?
2
A simple atomic force microscope-based method for quantifyi..:
Flater, Erin E.
;
Barnes, Jared D.
;
Hitz Graff, Jesse A.
...
Review of Scientific Instruments. 89 (2018) 11 - p. , 2018
Link:
https://doi.org/10.1063/..
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3
Towards easy and reliable AFM tip shape determination using..:
Flater, Erin E.
;
Zacharakis-Jutz, George E.
;
Dumba, Braulio G.
..
Ultramicroscopy. 146 (2014) - p. 130-143 , 2014
Link:
https://doi.org/10.1016/..
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4
Nanotribology of Octadecyltrichlorosilane Monolayers and Si..:
Flater, Erin E.
;
Ashurst, W. Robert
;
Carpick, Robert W.
Langmuir. 23 (2007) 18 - p. 9242-9252 , 2007
Link:
https://doi.org/10.1021/..
?
5
In situ wear studies of surface micromachined interfaces su..:
Flater, Erin E.
;
Corwin, Alex D.
;
de Boer, Maarten P.
.
Wear. 260 (2006) 6 - p. 580-593 , 2006
Link:
https://doi.org/10.1016/..
?
6
Accounting for the JKR–DMT transition in adhesion and frict..:
Grierson, D. S.
;
Flater, E. E.
;
Carpick, R. W.
Journal of Adhesion Science and Technology. 19 (2005) 3-5 - p. 291-311 , 2005
Link:
https://doi.org/10.1163/..
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7
Multiscale roughness and modeling of MEMS interfaces:
Bora, C.K.
;
Flater, E.E.
;
Street, M.D.
...
Tribology Letters. 19 (2005) 1 - p. 37-48 , 2005
Link:
https://doi.org/10.1007/..
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8
Atomic-scale friction and its connection to fracture mechan..:
Carpick, R. W.
;
Flater, E. E.
;
Sridharan, K.
..
JOM. 56 (2004) 10 - p. 48-52 , 2004
Link:
https://doi.org/10.1007/..
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9
Development of high density parts in the low-alloy, high-pe..:
Hager, E.M.
;
O'Hara, R.P.
;
Cobb, G.R.
...
Materials Science and Engineering: A. 838 (2022) - p. 142656 , 2022
Link:
https://doi.org/10.1016/..
?
10
Algorithms and Data Structures for New Models of Computatio:
Black, Paul E.
;
Flater, David
;
Bojanova, Irena
IT Professional. 23 (2021) 1 - p. 9-15 , 2021
Link:
https://doi.org/10.1109/..
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