Flege, J I
64  results:
Search for persons X
?
4

Characterization of ultrathin oxide films by LEEM/PEEM:

, In: Encyclopedia of Interfacial Chemistry,
Grinter, D.C. ; Flege, J.I. - p. 49-61 , 2018
 
?
6

Isotropic thin PTCDA films on GaN(0 0 0 1):

Ahrens, Ch ; Flege, J I ; Jaye, C...
Journal of Physics: Condensed Matter.  28 (2016)  47 - p. 475003 , 2016
 
?
7

Surface resonances in electron reflection from overlayers:

Krasovskii, E E ; Höcker, J ; Falta, J.
Journal of Physics: Condensed Matter.  27 (2014)  3 - p. 035501 , 2014
 
?
9

Growth and Morphology of Ceria on Ruthenium (0001):

Kaemena, B. ; Senanayake, S. D. ; Meyer, A....
The Journal of Physical Chemistry C.  117 (2012)  1 - p. 221-232 , 2012
 
?
10

Cleaning and growth morphology of GaN and InGaN surfaces:

Falta, J. ; Schmidt, Th. ; Gangopadhyay, S....
physica status solidi (b).  248 (2011)  8 - p. 1800-1809 , 2011
 
?
11

Mg and Si dopant incorporation and segregation in GaN:

Schmidt, Th. ; Siebert, M. ; Flege, J. I....
physica status solidi (b).  248 (2011)  8 - p. 1810-1821 , 2011
 
?
12

Ultra-thin high-quality silicon nitride films on Si(111):

Falta, J. ; Schmidt, Th. ; Gangopadhyay, S....
EPL (Europhysics Letters).  94 (2011)  1 - p. 16003 , 2011
 
?
14

Temperature dependent low energy electron microscopy study ..:

Speckmann, M ; Schmidt, Th ; Flege, J I...
Journal of Physics: Condensed Matter.  21 (2009)  31 - p. 314020 , 2009
 
?
15

Nanoscale analysis of Ru(0001) oxidation using low-energy a..:

Flege, J I ; Sutter, P
Journal of Physics: Condensed Matter.  21 (2009)  31 - p. 314018 , 2009
 
1-15