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2022 IEEE 20th Student Conference on Research and Development (SCOReD) ,
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Automated Fault Analyzer for March Algorithm Dynamic Fault ..:
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2022 IEEE 20th Student Conference on Research and Development (SCOReD) ,
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Modified March MSS for Unlinked Dynamic Faults Detection:
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2022 IEEE International Conference on Semiconductor Electronics (ICSE) ,
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Reduced March SR Algorithm for Deep-Submicron SRAM Testing:
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2023 IEEE 16th International Symposium on Embedded Multicore/Many-core Systems-on-Chip (MCSoC) ,
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