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2024 IEEE International Reliability Physics Symposium (IRPS) ,
1
A Methodology to Address RF Aging of 40nm CMOS PA Cells Und..:
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2023 International Electron Devices Meeting (IEDM) ,
4
A cost effective RF-SOI Drain Extended MOS transistor featu..:
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2022 45th Jubilee International Convention on Information, Communication and Electronic Technology (MIPRO) ,
7
Projector Calibration in a Two-Layer Flat Refractive Geomet..:
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2022 IEEE International Reliability Physics Symposium (IRPS) ,
9
Comprehensive Analysis of RF Hot-Carrier Reliability Sensit..:
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2021 IEEE International Electron Devices Meeting (IEDM) ,
14