Founta, Valeria
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2

Ru Stress Assessment by Membrane Wrinkling for Interconnect..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
 
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3

Stress and thermal stress evolution in Mo and Ru thin films:

, In: 2022 IEEE International Interconnect Technology Conference (IITC),
 
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