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Frazzetto, Alessia
24
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Online (24)
Mediatypes
Articles (Online) (14)
OpenAccess-fulltext (10)
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1
Electrical characterization of trapping phenomena at SiO2/S..:
Fiorenza, Patrick
;
Greco, Giuseppe
;
Vivona, Marilena
...
physica status solidi (a). 214 (2016) 4 - p. 1600366 , 2016
Link:
https://doi.org/10.1002/..
?
2
Conduction Mechanisms at SiO2/4H-SiC Interfaces in MOS-Base..:
Fiorenza, Patrick
;
Giannazzo, Filippo
;
Frazzetto, Alessia
...
Materials Science Forum. 858 (2016) - p. 705-708 , 2016
Link:
https://doi.org/10.4028/..
?
3
Industrial Approach for Next Generation of Power Devices Ba..:
Saggio, Mario
;
Guarnera, Alfio
;
Zanetti, Edoardo
...
Materials Science Forum. 821-823 (2015) - p. 660-666 , 2015
Link:
https://doi.org/10.4028/..
?
4
Fowler-Nordheim tunneling at SiO2/4H-SiC interfaces in meta..:
Fiorenza, Patrick
;
Frazzetto, Alessia
;
Guarnera, Alfio
..
Applied Physics Letters. 105 (2014) 14 - p. , 2014
Link:
https://doi.org/10.1063/..
?
5
Characterization of SiO2/SiC Interfaces Annealed in N2O or ..:
Fiorenza, Patrick
;
Swanson, Lukas K.
;
Vivona, Marilena
...
Materials Science Forum. 778-780 (2014) - p. 623-626 , 2014
Link:
https://doi.org/10.4028/..
?
6
Comparative Study of the Current Transport Mechanisms in Ni..:
Vivona, Marilena
;
Greco, Giuseppe
;
Di Franco, Salvatore
...
Materials Science Forum. 778-780 (2014) - p. 665-668 , 2014
Link:
https://doi.org/10.4028/..
?
7
A look underneath the SiO2/4H-SiC interface after N2O therm..:
Fiorenza, Patrick
;
Giannazzo, Filippo
;
Swanson, Lukas K
...
Beilstein Journal of Nanotechnology. 4 (2013) - p. 249-254 , 2013
Link:
https://doi.org/10.3762/..
?
8
A Nanoscale Look in the Channel of 4H-SiC Lateral MOSFETs:
Fiorenza, Patrick
;
Frazzetto, Alessia
;
Swanson, Lukas K.
..
Materials Science Forum. 740-742 (2013) - p. 699-702 , 2013
Link:
https://doi.org/10.4028/..
?
9
Influence of the surface morphology on the channel mobility..:
Fiorenza, Patrick
;
Giannazzo, Filippo
;
Frazzetto, Alessia
.
Journal of Applied Physics. 112 (2012) 8 - p. , 2012
Link:
https://doi.org/10.1063/..
?
10
Effects of Different Post-Implantation Annealing Conditions..:
Frazzetto, Alessia
;
Roccaforte, Fabrizio
;
Giannazzo, Filippo
...
Materials Science Forum. 717-720 (2012) - p. 825-828 , 2012
Link:
https://doi.org/10.4028/..
?
11
Microstructure and Transport Properties in Alloyed Ohmic Co..:
Roccaforte, Fabrizio
;
Frazzetto, Alessia
;
Greco, Giuseppe
...
Materials Science Forum. 711 (2012) - p. 203-207 , 2012
Link:
https://doi.org/10.4028/..
?
12
Impact of Surface Morphology on the Electrical Properties o..:
Frazzetto, Alessia
;
Roccaforte, Fabrizio
;
Giannazzo, Filippo
...
Materials Science Forum. 679-680 (2011) - p. 413-416 , 2011
Link:
https://doi.org/10.4028/..
?
13
Nanoscale electro-structural characterisation of ohmic cont..:
Frazzetto, Alessia
;
Giannazzo, Filippo
;
Lo Nigro, Raffaella
...
Nanoscale Research Letters. 6 (2011) 1 - p. , 2011
Link:
https://doi.org/10.1186/..
?
14
Near-surface processing on AlGaN/GaN heterostructures: a na..:
Greco, Giuseppe
;
Giannazzo, Filippo
;
Frazzetto, Alessia
..
Nanoscale Research Letters. 6 (2011) 1 - p. , 2011
Link:
https://doi.org/10.1186/..
?
15
Characterization of SiO 2 /SiC Interfaces Annealed in N 2 O..:
Fiorenza, Patrick
;
Swanson, Lukas K
;
Vivona, Marilena
...
https://zenodo.org/record/890825. , 2014
Link:
https://zenodo.org/recor..
1-15