Funaki, Tsuyoshi
124  results:
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1

Evaluation of Phase Measurement Error in Digital Oscillosco..:

, In: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC),
 
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3

Analysis and Design of Class-E Amplifier with Nonlinear Out..:

Seki, Shota ; Funaki, Tsuyoshi
IEEJ Journal of Industry Applications.  13 (2024)  4 - p. 437-444 , 2024
 
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5

Issues of Using Unsaturated Heating Time for Transient Ther..:

, In: 2024 International Conference on Electronics Packaging (ICEP),
 
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6

Comparison between Experimental and FEM Simulation Results ..:

, In: 2023 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia),
Deepankar ; Ibuchi, Takaaki ; Funaki, Tsuyoshi... - p. 1-4 , 2023
 
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7

An Experimental Study on Conducted EMI Characteristics of A..:

, In: 2023 IEEE Fifth International Conference on DC Microgrids (ICDCM),
Ibuchi, Takaaki ; Funaki, Tsuyoshi - p. 1-6 , 2023
 
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8

Evaluation of Thermal Resistance Reduction by Thinning Subs..:

, In: 2023 International Conference on Electronics Packaging (ICEP),
Seki, Shota ; Funaki, Tsuyoshi ; Arima, Jun... - p. 193-194 , 2023
 
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9

Issues of Using Unsaturated Heating Time for Transient Ther..:

, In: 2023 International Conference on Electronics Packaging (ICEP),
 
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10

Parametric Analysis for Filter Design in Extracting Transie..:

, In: 2023 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia),
 
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12

Reliability Improvement of 3.3 kV Full-SiC Power Modules fo..:

Yasui, Kan ; Hayakawa, Seiichi ; Funaki, Tsuyoshi
IEEE Transactions on Components, Packaging and Manufacturing Technology.  13 (2023)  9 - p. 1476-1485 , 2023
 
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13

Power Conversion Efficiency Improvement of High Voltage Pow..:

, In: 2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe),
 
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14

Development of reliable multi-chip power modules with paral..:

, In: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
 
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15

Transient thermal characterization of β-Ga2O3 Schottky barr..:

Seki, Shota ; Funaki, Tsuyoshi ; Arima, Jun...
IEICE Electronics Express.  19 (2022)  6 - p. 20210558-20210558 , 2022
 
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