Gautsch, S
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2

Remote Nanoimaging on Mars - Results of the Atomic Force Mi..:

Gautsch, S ; Parrat, D ; de Rooij, N...
Microscopy and Microanalysis.  17 (2011)  S2 - p. 864-865 , 2011
 
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3

Pattern transfer and post processing of complex nanostructu..:

Gautsch, S. ; de Rooij, N.F.
Microelectronic Engineering.  88 (2011)  8 - p. 2533-2536 , 2011
 
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4

Microcolumn with variable axis lens for large scan fields a..:

Weigand, H. ; Gautsch, S. ; Strohmaier, W....
Microelectronic Engineering.  88 (2011)  8 - p. 2431-2434 , 2011
 
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6

Complex nanostructures in PMMA made by a single process ste..:

Gautsch, S. ; Studer, M. ; de Rooij, N.F.
Microelectronic Engineering.  87 (2010)  5-8 - p. 1139-1142 , 2010
 
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8

Measurement of quartz particles by means of an atomic force..:

Gautsch, S. ; Akiyama, T. ; Imer, R....
Surface and Interface Analysis.  33 (2002)  2 - p. 163-167 , 2002
 
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9

Atomic force microscope for planetary applications:

Akiyama, T. ; Gautsch, S. ; de Rooij, N.F....
Sensors and Actuators A: Physical.  91 (2001)  3 - p. 321-325 , 2001
 
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15

Untersuchung von Wasser und Abwasser:

Mayer, Otto ; Winkler, L. W. ; Prescher, J....
Fresenius' Zeitschrift für analytische Chemie; Zeitschrift für analytische Chemie.  98 (1934)  11-12 - p. 447-456 , 1934
 
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