Ge, Ruijing
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2

Electron irradiation-induced defects for reliability improv..:

Wu, Xiaohan ; Gu, Yuqian ; Ge, Ruijing...
npj 2D Materials and Applications.  6 (2022)  1 - p. , 2022
 
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5

On the stochastic nature of conductive points formation and..:

Huang, Yifu ; Wu, Xiaohan ; Gu, Yuqian...
Microelectronics Reliability.  126 (2021)  - p. 114274 , 2021
 
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6

Atomristors: Non-Volatile Resistance Switching in 2D Monola..:

, In: 2020 Pan Pacific Microelectronics Symposium (Pan Pacific),
Wu, Xiaohan ; Ge, Ruijing ; Kim, Myungsoo.. - p. 1-6 , 2020
 
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7

List of contributors:

, In: Emerging 2D Materials and Devices for the Internet of Things,
Akinwande, Deji ; Chen, Jian ; Chen, Lin... - p. xi-xiv , 2020
 
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9

Two-dimensional materials-based nonvolatile resistive memor..:

, In: Emerging 2D Materials and Devices for the Internet of Things,
Ge, Ruijing ; Wu, Xiaohan ; Kim, Myungsoo.. - p. 1-28 , 2020
 
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14

Non-volatile RF and mm-wave Switches Based on Monolayer hBN:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Kim, Myungsoo ; Pallecchi, Emiliano ; Ge, Ruijing... - p. 9.5.1-9.5.4 , 2019
 
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