E-LIB Suche - Ergebnisse für: Gerardin, Simone

1

Total Ionizing Dose Effects in 3-D NAND Replacement Gate Fl..:

Bagatin, Marta ; Gerardin, Simone ; Paccagnella, Alessandro.
IEEE Transactions on Nuclear Science. 71 (2024) 4 - p. 412-417 , 2024

Link: https://doi.org/10.1109/..

2

Radiation-Induced Charge Trapping in Shallow Trench Isolati..:

Bonaldo, Stefano ; Wallace, Trace ; Barnaby, Hugh...
IEEE Transactions on Nuclear Science. 71 (2024) 4 - p. 427-436 , 2024

Link: https://doi.org/10.1109/..

3

Impact of Tier Pitch Scaling on Heavy-ion Sensitivity of 3D..:

Bagatin, Marta ; Gerardin, Simone ; Paccagnella, Alessandro..
IEEE Transactions on Nuclear Science. , 2024

Link: https://doi.org/10.1109/..

4

Influence of Bulk Doping and Halos on the TID Response of I..:

Bonaldo, Stefano ; Mattiazzo, Serena ; Bagatin, Marta...
Electronics. 12 (2023) 3 - p. 543 , 2023

Link: https://doi.org/10.3390/..

5

Total-Ionizing-Dose Effects at Ultrahigh Doses in AlGaN/GaN..:

Bonaldo, Stefano ; Zhang, En Xia ; Mattiazzo, Serena...
IEEE Transactions on Nuclear Science. 70 (2023) 8 - p. 2042-2050 , 2023

Link: https://doi.org/10.1109/..

6

Single Event Effects in 3-D NAND Flash Memory Cells With Re..:

Bagatin, Marta ; Gerardin, Simone ; Paccagnella, Alessandro...
IEEE Transactions on Nuclear Science. 70 (2023) 4 - p. 308-313 , 2023

Link: https://doi.org/10.1109/..

7

TID Effects in Highly Scaled Gate-All-Around Si Nanowire CM..:

Bonaldo, Stefano ; Gorchichko, Mariia ; Zhang, En Xia...
IEEE Transactions on Nuclear Science. 69 (2022) 7 - p. 1444-1452 , 2022

Link: https://doi.org/10.1109/..

8

Radiation Tolerant Multi-Bit Flip-Flop System With Embedded..:

Jain, Abhishek ; Veggetti, Andrea Mario ; Crippa, Dennis...
IEEE Journal of Solid-State Circuits. 57 (2022) 9 - p. 2878-2890 , 2022

Link: https://doi.org/10.1109/..

9

The General Chairman's Address : Welcome to the Proceedings..:

, In: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS),

Gerardin, Simone - p. 1-1 , 2022

Link: https://doi.org/10.1109/..

10

Increased Device Variability Induced by Total Ionizing Dose..:

Ma, Teng ; Bonaldo, Stefano ; Mattiazzo, Serena...
IEEE Transactions on Nuclear Science. 69 (2022) 7 - p. 1437-1443 , 2022

Link: https://doi.org/10.1109/..

11

SEE Testing of COTS Microcontroller and Operational Amplifi..:

, In: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS),

Wind, Michael ; Tscherne, Christoph ; Huber, Lukas... - p. 1-8 , 2022

Link: https://doi.org/10.1109/..

12

DC response, low-frequency noise, and TID-induced mechanism..:

Bonaldo, Stefano ; Ma, Teng ; Mattiazzo, Serena...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 1033 (2022) - p. 166727 , 2022

Link: https://doi.org/10.1016/..

13

Testing of COTS Multiplexer in the Framework of the ESA COR..:

, In: 2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS),

Wind, Michael ; Tscherne, Christoph ; Bagatin, Marta... - p. 1-7 , 2021

Link: https://doi.org/10.1109/..

14

First Tests of a New Facility for Device-Level, Board-Level..:

CAZZANIGA, CARLO ; BAGATIN, MARTA ; GERARDIN, SIMONE..
IEEE Transactions on Emerging Topics in Computing. 9 (2021) 1 - p. 104-108 , 2021

Link: https://doi.org/10.1109/..

15

Thermal Neutron-Induced SEUs in the LHC Accelerator Environ..:

Cecchetto, Matteo ; Garcia Alia, Ruben ; Wrobel, Frederic...
IEEE Transactions on Nuclear Science. 67 (2020) 7 - p. 1412-1420 , 2020

Link: https://doi.org/10.1109/..