Ghibaudo, Gerard
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3

Drain Current Variability in 2-levels Stacked Nanowire Gate..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
 
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7

The core-shell junctionless MOSFET:

Cristoloveanu, Sorin ; Ghibaudo, Gérard
Solid-State Electronics.  200 (2023)  - p. 108567 , 2023
 
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8

A 0.9 V, 8T2R nvSRAM Memory Cell with High Density and Impr..:

Yin, Jiayu ; Liao, Wenli ; Chen, Chengying.
Active and Passive Electronic Components.  2023 (2023)  - p. 1-11 , 2023
 
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12

In-depth electrical characterization of deca-nanometer InGa..:

, In: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC),
 
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15

Electrical characterization and modeling of FDSOI MOSFETs f..:

, In: 2022 IEEE 15th Workshop on Low Temperature Electronics (WOLTE),
 
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