Gilgenbach, Colin
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3

Investigating Qubits in Silicon Carbide Using Multislice El..:

Gilgenbach, Colin ; Bhat, Aaditya ; LeBeau, James
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 1737-1737 , 2023
 
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5

Three-dimensional Analysis of Nanoscale Dislocation Loops w..:

Gilgenbach, Colin ; Chen, Xi ; Xu, Michael.
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 286-287 , 2023
 
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6

Characterization of Quantum Emitters and Extended Defects i..:

Chen, Xi ; Gilgenbach, Colin ; LeBeau, James M
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 342-343 , 2023
 
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