Giorgino, Giovanni
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4

Study of 100V GaN power devices in dynamic condition and Ga..:

Giorgino, Giovanni ; Cioni, Marcello ; Miccoli, Cristina...
e-Prime - Advances in Electrical Engineering, Electronics and Energy.  6 (2023)  - p. 100338 , 2023
 
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Unveiling the Role of Hole Barrier Traps on ON-Resistance I..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),
 
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Gate-Bias Induced RON Instability in p-GaN Power HEMTs:

Chini, Alessandro ; Zagni, Nicolo' ; Verzellesi, Giovanni...
info:eu-repo/semantics/altIdentifier/wos/WOS:001001401500010.  , 2023
 
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8

Study of 100V GaN power devices in dynamic condition and Ga..:

Giovanni Giorgino ; Marcello Cioni ; Cristina Miccoli...
http://www.sciencedirect.com/science/article/pii/S2772671123002334.  , 2023
 
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