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2023 IEEE European Test Symposium (ETS) ,
8
Intra-cell Resistive-Open Defect Analysis on a Foundry 8T S..:
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2023 IEEE International Test Conference (ITC) ,
11
Predictor BIST: An "All-in-One" Optical Test Solution for C..:
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2023 IEEE European Test Symposium (ETS) ,
14