Glatzel, Th
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2

Dopant imaging of power semiconductor device cross sections:

Gysin, U. ; Meyer, E. ; Glatzel, Th....
Microelectronic Engineering.  160 (2016)  - p. 18-21 , 2016
 
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3

Hydrogen-induced buckling of gold films:

Eren, B ; Marot, L ; Günzburger, G...
Journal of Physics D: Applied Physics.  47 (2013)  2 - p. 025302 , 2013
 
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4

Contrast inversion of the h-BN nanomesh investigated by nc-..:

Koch, S ; Langer, M ; Kawai, S..
Journal of Physics: Condensed Matter.  24 (2012)  31 - p. 314212 , 2012
 
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10

Interface engineering in chalcopyrite thin film solar devic..:

Fischer, Ch.-H. ; Bär, M. ; Glatzel, Th...
Solar Energy Materials and Solar Cells.  90 (2006)  10 - p. 1471-1485 , 2006
 
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15

Characterization of quantum wells by cross-sectional Kelvin..:

Douhéret, O. ; Anand, S. ; Glatzel, Th...
Applied Physics Letters.  85 (2004)  22 - p. 5245-5247 , 2004
 
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