Gołek, F.
25  results:
Search for persons X
?
1

Physica status solidi 

Volume 117, Number 1: January 16  Physica status solidi ; Volume 117, Number 1, A
Abrosimova, G. E ; Ahmed, S ; Akinaga, H... - Reprint 2021 . , [2021]
 
?
2

Note: Work function change measurement via improved Anderso..:

Sabik, A. ; Gołek, F. ; Antczak, G.
Review of Scientific Instruments.  86 (2015)  5 - p. 056111 , 2015
 
?
3

AFM image artifacts:

Gołek, F. ; Mazur, P. ; Ryszka, Z..
Applied Surface Science.  304 (2014)  - p. 11-19 , 2014
 
?
4

Morphology of alkali halide thin films:

Gołek, F. ; Mazur, P. ; Ryszka, Z..
Applied Surface Science.  254 (2008)  14 - p. 4292-4296 , 2008
 
?
5

Morphology of alkali halide thin films studied by AFM:

Golek, F. ; Mazur, P. ; Ryszka, Z..
Surface Science.  600 (2006)  8 - p. 1689-1696 , 2006
 
?
6

Morphology of LiBr/LiF system studied by C‐AFM:

Mazur, P. ; Gołek, F.
physica status solidi (a).  202 (2005)  14 - p. , 2005
 
?
8

ESD thresholds for NaCl:

Gołek, F.
Applied Surface Science.  225 (2004)  1-4 - p. 267-271 , 2004
 
?
9

ESD thresholds for KCl:

Gołek, F.
physica status solidi (b).  239 (2003)  2 - p. 336-339 , 2003
 
?
10

LiF thin layers on Si studied by ESD, LEED, AES, and AFM:

Gołek, F ; Mazur, P
Surface Science.  541 (2003)  1-3 - p. 173-181 , 2003
 
?
 
?
12

Electron beam induced alteration of LiF thin films monitore..:

Gołek, F.
Surface Science.  448 (2000)  1 - p. L188-L192 , 2000
 
?
13

Electron beam induced alteration of LiF thin films monitore..:

Gołek, F. ; Sobolewski, W.J.
Solid State Communications.  110 (1999)  3 - p. 143-146 , 1999
 
?
14

Electron-stimulated desorption from LiF on Si(100):

Markowski, L. ; Gołek, F.
Surface Science.  425 (1999)  2-3 - p. 287-295 , 1999
 
?
 
1-15