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2024 IEEE European Test Symposium (ETS) ,
1
Scan Design Using Unsupervised Machine Learning to Reduce F..:
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2023 IEEE International Test Conference (ITC) ,
2
A Case Study on IEEE 1838 Compliant Multi-Die 3DIC DFT Impl..:
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Proceedings of the 2022 International Symposium on Physical Design ,
4
Challenges and Solutions for 3D Fabric: A Foundry Perspecti..:
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2022 IEEE 40th VLSI Test Symposium (VTS) ,
5
Innovative Practices Track: Test of 3D ICs & Chiplets:
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Proceedings of the International Conference on Computer-Aided Design ,
8
Test challenges in designing complex 3D chips : what is ..:
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Proceedings of the Conference on Design, Automation and Test in Europe ,
9
EDA solutions to new-defect detection in advanced process t..:
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Proceedings of the 43rd annual Design Automation Conference ,
11
Fault detection and diagnosis with parity trees for space c..:
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Proceedings of the conference on Design, Automation and Test in Europe - Volume 1 ,
13
On-Chip Test Infrastructure Design for Optimal Multi-Site T..:
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Proceedings of the conference on Design, automation and test in Europe - Volume 3 ,
14