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Goel, Sandeep Kumar
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1

Scan Design Using Unsupervised Machine Learning to Reduce F..:

, In: 2024 IEEE European Test Symposium (ETS),
Goel, Sandeep Kumar ; Patidar, Ankita ; Lee, Frank - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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2

A Case Study on IEEE 1838 Compliant Multi-Die 3DIC DFT Impl..:

, In: 2023 IEEE International Test Conference (ITC),
Chandra, Anshuman ; Khan, Moiz ; Patidar, Ankita... - p. 11-20 , 2023
Link: https://doi.org/10.1109/..
 
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3

An analysis of integrated reporting practices of selected I..:

Tailor, R.K. ; Goel, Sandeep Kumar ; Jain, Stuti..
Journal of Management Research and Analysis.  10 (2023)  2 - p. 116-123 , 2023
Link: https://doi.org/10.18231..
 
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4

Challenges and Solutions for 3D Fabric: A Foundry Perspecti..:

, In: Proceedings of the 2022 International Symposium on Physical Design,
Goel, Sandeep Kumar - p. 93 ff. , 2022
Link: https://dl.acm.org/doi/1..
 
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5

Innovative Practices Track: Test of 3D ICs & Chiplets:

, In: 2022 IEEE 40th VLSI Test Symposium (VTS),
Goel, Sandeep Kumar ; Pendharkar, Sandeep ; Liu, Chunsheng - p. 1-1 , 2022
Link: https://doi.org/10.1109/..
 
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6

Design optimization of permanent magnet synchronous motor u..:

Gope, Deepayan ; Goel, Sandeep Kumar
International Journal of Emerging Electric Power Systems.  22 (2020)  1 - p. 9-20 , 2020
Link: https://doi.org/10.1515/..
 
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7

Low-Cost Post-Bond Testing of 3-D ICs Containing a Passive ..:

Chi, Chun-Chuan ; Marinissen, Erik Jan ; Goel, Sandeep Kumar.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  22 (2014)  11 - p. 2388-2401 , 2014
Link: https://doi.org/10.1109/..
 
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8

Test challenges in designing complex 3D chips : what is ..:

, In: Proceedings of the International Conference on Computer-Aided Design,
Goel, Sandeep Kumar - p. 273 ff. , 2012
Link: https://dl.acm.org/doi/1..
 
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9

EDA solutions to new-defect detection in advanced process t..:

, In: Proceedings of the Conference on Design, Automation and Test in Europe,
Marinissen, Erik Jan ; Vandling, Gilbert ; Goel, Sandeep Kumar... - p. 123-128 , 2012
Link: https://dl.acm.org/doi/1..
 
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10

Analytical Solutions of Electromagnetic Fields in Prismatic..:

Mukerji, Saurabh Kumar ; Ramamurthy, M. B. ; Goel, Sandeep Kumar
The International Journal of Electrical Engineering & Education.  45 (2008)  1 - p. 17-25 , 2008
Link: https://doi.org/10.7227/..
 
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11

Fault detection and diagnosis with parity trees for space c..:

, In: Proceedings of the 43rd annual Design Automation Conference,
Vranken, Harald ; Goel, Sandeep Kumar ; Glowatz, Andreas.. - p. 1095-1098 , 2006
Link: https://dl.acm.org/doi/1..
 
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12

Experimental Determination of Equivalent-Circuit Parameters..:

Mukerji, Saurabh Kumar ; Goel, Sandeep Kumar ; Basu, Kartik Prasad
The International Journal of Electrical Engineering & Education.  43 (2006)  4 - p. 352-357 , 2006
Link: https://doi.org/10.7227/..
 
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13

On-Chip Test Infrastructure Design for Optimal Multi-Site T..:

, In: Proceedings of the conference on Design, Automation and Test in Europe - Volume 1,
Goel, Sandeep Kumar ; Marinissen, Erik Jan - p. 44-49 , 2005
Link: https://dl.acm.org/doi/1..
 
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14

Test Infrastructure Design for the Nexperia™ Home Platform ..:

, In: Proceedings of the conference on Design, automation and test in Europe - Volume 3,
Goel, Sandeep Kumar ; Chiu, Kuoshu ; Marinissen, Erik Jan.. - p. 30108 ff. , 2004
Link: https://dl.acm.org/doi/1..
 
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15

SOC test architecture design for efficient utilization of t..:

Goel, Sandeep Kumar ; Marinissen, Erik Jan
ACM Transactions on Design Automation of Electronic Systems (TODAES).  8 (2003)  4 - p. 399-429 , 2003
Link: https://dl.acm.org/doi/1..
 
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