Goyal, Anshu
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1

Annealing of MBE-grown CdTe epitaxial layer at various tell..:

Tyagi, Subodh ; Goyal, Anshu ; Rana, Sovinder Singh...
Journal of Materials Science: Materials in Electronics.  35 (2024)  14 - p. , 2024
 
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2

Structural and optical properties of arsenic-oxide microcry..:

Dhaka, Rangeeta ; Yadav, Aditya ; Goyal, Anshu...
Materials Chemistry and Physics.  315 (2024)  - p. 129005 , 2024
 
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3

The influence of nitrogen and boron doping on the surface m..:

Shukla, Vivek K. ; J., Lekshmi ; Yadav, Brajesh S....
International Journal of Refractory Metals and Hard Materials.  119 (2024)  - p. 106559 , 2024
 
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5

Liquid Phase Exfoliation and Characterization of Few Layer ..:

Sharma, Rohit ; Kumar, Ashish ; Dawar, Anit...
Transactions on Electrical and Electronic Materials.  24 (2023)  2 - p. 140-148 , 2023
 
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6

Compositional, electrical and thermal properties of nonstoi..:

Yadav, Isha ; Jain, Surbhi ; Joshi, Shalik Ram...
Materials Science in Semiconductor Processing.  148 (2022)  - p. 106779 , 2022
 
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11

Impact of growth conditions on intrinsic carbon doping in G..:

Khan, Ruby ; Arora, Aman ; Jain, Anubha...
Journal of Materials Science: Materials in Electronics.  31 (2020)  17 - p. 14336-14344 , 2020
 
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12

Polytype switching identification in 4H-SiC single crystal ..:

Arora, Aman ; Pandey, Akhilesh ; Patel, Ankit...
Journal of Materials Science: Materials in Electronics.  31 (2020)  19 - p. 16343-16351 , 2020
 
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14

Surface Study of AlGaN/GaN High Electron Mobility Transisto..:

, In: Springer Proceedings in Physics; The Physics of Semiconductor Devices,
 
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15

Studies on Iodine Based Polishing of HgCdTe Material:

, In: Springer Proceedings in Physics; The Physics of Semiconductor Devices,
Nokhwal, Radheshyam ; Goyal, Anshu ; Sharma, B. L.... - p. 1111-1116 , 2019
 
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