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Grünenpütt, Jan
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1

Transconductance Overshoot, a New Trap-Related Effect in Al..:

Zhan, Gao ; Rampazzo, Fabiana ; De Santi, Carlo...
IEEE Transactions on Electron Devices.  70 (2023)  6 - p. 3005-3010 , 2023
Link: https://doi.org/10.1109/..
 
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2

Study of the influence of gate etching and passivation on c..:

Chiocchetta, F. ; De Santi, C. ; Rampazzo, F....
Microelectronics Reliability.  138 (2022)  - p. 114735 , 2022
Link: https://doi.org/10.1016/..
 
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3

Impact of in situ NH3 pre-treatment of LPCVD SiN passivatio..:

Chen, Ding-Yuan ; Persson, Axel R ; Wen, Kai-Hsin...
Semiconductor Science and Technology.  37 (2022)  3 - p. 035011 , 2022
Link: https://doi.org/10.1088/..
 
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4

Impact of an AlGaN spike in the buffer in 0.15 μm AlGaN/GaN..:

Gao, Zhan ; Rampazzo, Fabiana ; Meneghini, Matteo...
Microelectronics Reliability.  126 (2021)  - p. 114318 , 2021
Link: https://doi.org/10.1016/..
 
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5

Improvement of Ohmic Contact for InAlGaN/AlN/GaN HEMTs with..:

Riedmüller, Sandra ; Steinmann, Claudia ; Grünenpütt, Jan..
physica status solidi (a).  215 (2018)  8 - p. , 2018
Link: https://doi.org/10.1002/..
 
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